Lifetime Prediction of Optocouplers in Digital Input and Output Modules based on Bayesian tracking approaches
Insun Shin,
Daeil Kwon
Abstract:In recent years, reliability of DIO modules has been drawing much attention from manufacturing companies under the growing complexity of automation systems for smart factory establishment. In manufacturing systems, DIO modules have been widely used to pass sensor measurements and configuration input signals for controlling actuators. Because sensor measurement and control signals pass through DIO modules, the faults of DIO modules would cause malfunctions or failures of the smart manufacturing systems and even… Show more
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