Lifetime estimation of high-temperature high-voltage polymer film capacitor based on capacitance loss

Makdessi, Maawad; Sarı, Ali; Venet, Pascal; Aubard, Guillaume; Chevalier, Florian; Préseau, R.; Doytchinov, T.; Duwattez, Jimmy

doi:10.1016/j.microrel.2015.06.099

Cited by 22 publications

(13 citation statements)

References 11 publications

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“…2) The shape of L:W:H = 5:5:6 is found to be the most dangerous shape causing the highest HIT for the c-BCB/BNNS-based capacitor. This result is valuable for practical reference, because even when the internal temperature does not reach T g , relatively high temperature can have a detrimental influence on capacitors like faster aging [16] and much lower mechanical strength [19].…”

Section: Conclusion and Discussionmentioning

confidence: 99%

“…And unlike the metal foil electrode with thickness of tens of microns, the metalized layer in MFCs is typically a few hundred Angstroms and thus provide very limited heat conduction [14]. In this context, the thermal degradation, one of the main capacitor aging factor, can cause irreversible polymer breakdowns from excess activation energy and free-radical chemical reactions with surrounding compounds [15,16]. When considering its special winding structure, MFC is particularly sensitive to internal temperature rise.…”

Section: Introductionmentioning

confidence: 99%

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Enabling aqueous processing for crack-free thick electrodes

Rollag

et al. 2017

Journal of Power Sources

120

118

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The objective of this paper is to design and optimize the high temperature metalized thin-film polymer capacitor by a combined computational and experimental method. A finite-element based thermal model is developed to incorporate Joule heating and anisotropic heat conduction arising from anisotropic geometric structures of the capacitor. The anisotropic thermal conductivity and temperature dependent electrical conductivity required by the thermal model are measured from the experiments. The polymer represented by thermally crosslinking benzocyclobutene (BCB) in the presence of boron nitride nanosheets (BNNSs) is selected for high temperature capacitor design based on the results of highest internal temperature (HIT) and the time to achieve thermal equilibrium. The c-BCB/BNNS-based capacitor aiming at the operating temperature of 250 °C is geometrically optimized with respect to its shape and volume. "Safe line" plot is also presented to reveal the influence of the cooling strength on capacitor geometry design.

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Section: Conclusion and Discussionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Enabling aqueous processing for crack-free thick electrodes

Rollag

et al. 2017

Journal of Power Sources

120

118

View full text Add to dashboard Cite

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“…The model is an exponential function of the applied voltage and temperature. The model parameters are identified by fitting the curves to the experiment data under different ageing test conditions [3]. A calendar-aging model [8] is developed based on the classical Eyring's law.…”

Section: Prediction Of Capacitor's Accelerated Ageing Based On Advancmentioning

confidence: 99%

“…During the degradation process, the values of the capacitance and the ESR indicate the level of degradation since these values will noticeably shift when the capacitors are subject to an (accelerated) ageing process. There are two criteria indicating the end-of-life of capacitors: a) the ESR value reaches 2 times the initial value, b) the capacitance decreases in excess of 20% of the initial value [3]. An increased ESR results in more power dissipation and a decreased capacitance weakens the capability to handle ripple voltages.…”

Section: Capacitors Under Testmentioning

confidence: 99%

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Prediction of Capacitor’s Accelerated Aging Based on Advanced Measurements and Deep Neural Network Techniques

Liu

Claeys

Pissoort

et al. 2020

IEEE Trans. Instrum. Meas.

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Capacitors are widely used in electronic systems and have a key function in EMC (electromagnetic compatibility) compliance. However, the ageing of capacitors results in an alteration of their parameters, which could pose a threat on the normal operation of systems as well as their EMC compliance. Normally, accelerated ageing is employed to shorten the experiment time. After the ageing, the capacitance and equivalent series resistance (ESR) are measured to evaluate the ageing process. In this paper, a new continuous characterization measurement setup is implemented in which the accelerated ageing of the capacitors under test (CUTs) is continuously monitored during the overall accelerated ageing process. It significantly improves the continuity of the measurement and eliminates the errors attributed to the interrupting of the ageing process. This method is validated by comparing measurement results from the new measurement method with results of the conventional method. This was done by subjecting two types of film capacitors to thermal and electrical stress in order to evaluate the accelerated ageing effects. Furthermore, a conditional deep neural network with dropout technique is proposed to predict the accelerated ageing conditions of the capacitors. Instead of only forecasting the failure threshold, the proposed network is able to dynamically predict the accelerated ageing conditions at different elevated temperatures and voltages. This leads to a serious reduction of the total measurement time: from 1000h to 200h.

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