Lifetime Estimation of a Photovoltaic Module Subjected to Corrosion Due to Damp Heat Testing

Photovoltaic modules and systems lifetime and availability are difficult to determine and not really well-known. This information is an important data to insure the installation performance of such a system and to prepare its recycling. The aim of this article is to present a methodology for the availability and lifetime evaluation of a photovoltaic system using the Petri networks method. Each component -module, wires and inverter -is detailed in Petri networks and several laws are used in order to estimate the reliability. Several guides (FIDES, MIL-HDBK-217 ...) allow determining the reliability of electronic components using collections of data. For photovoltaic modules, accelerated life testing are carried out for the evaluation of the lifetime which is described by a Weibull distribution. Results obtained show that Petri networks are very useful to simulate lifetime thanks to its intrinsic modularity.

show abstract

“…From Laronde [13] the failure probability of a single photovoltaic module follows a Weibull distribution with β = 2.6 and η = 369038 hours.…”

Section: Photovoltaic Arraymentioning

confidence: 99%

Photovoltaic system lifetime prediction using Petri networks method

Laronde¹,

Charki²,

Bigaud³

et al. 2010

SPIE Proceedings

View full text Add to dashboard Cite

show abstract

“…This degradation results from exposure to environmental conditions and has significant consequences with regard to PV performance lifetimes [1][2][3][4] . Specifically, weather conditions in the area of PV installations play a large role in the degradation of PV module performance [5,6] .…”

Section: Introductionmentioning

confidence: 99%

“…Specifically, weather conditions in the area of PV installations play a large role in the degradation of PV module performance [5,6] . High relative humidity, extremes in temperature (both high and low), and prolonged exposure to solar radiation are responsible for many modes of failure in PV modules including corrosion of devices or contacts, delamination, backsheet cracking, and cell cracking, among others [1,[7][8][9] .…”

Section: Introductionmentioning

confidence: 99%

Environmental aging in polycrystalline-Si photovoltaic modules: comparison of chamber-based accelerated degradation studies with field-test data

et al. 2015

View full text Add to dashboard Cite

Lifecycle degradation testing of photovoltaic (PV) modules in accelerated-degradation chambers can enable the prediction both of PV performance lifetimes and of return-on-investment for installations of PV systems. With degradation results strongly dependent on chamber test parameters, the validity of such studies relative to fielded, installed PV systems must be determined. In the present work, accelerated aging of a 250 W polycrystalline silicon module is compared to real-time performance degradation in a similar polycrystalline-silicon, fielded, PV technology that has been operating since October 2013. Investigation of environmental aging effects are performed in a full-scale, industrial-standard environmental chamber equipped with single-sun irradiance capability providing illumination uniformity of 98% over a 2 x 1.6 m area. Time-dependent, photovoltaic performance (J-V) is evaluated over a recurring, compressed night-day cycle providing representative local daily solar insolation for the southwestern United States, followed by dark (night) cycling. This cycle is synchronized with thermal and humidity environmental variations that are designed to mimic, as closely as possible, test-yard conditions specific to a 12 month weather profile for a fielded system in Tucson, AZ. Results confirm the impact of environmental conditions on the module long-term performance. While the effects of temperature de-rating can be clearly seen in the data, removal of these effects enables the clear interpretation of module efficiency degradation with time and environmental exposure. With the temperature-dependent effect removed, the normalized efficiency is computed and compared to performance results from another panel of similar technology that has previously experienced identical climate changes in the test yard. Analysis of relative PV module efficiency degradation for the chamber-tested system shows good comparison to the field-tested system with ~2.5% degradation following an equivalent year of testing.

show abstract

“…In the absence of such a model, while one may quantify PID response of a fully assembled module to specific RH and temperature, one cannot predict PID response if any component of the module or the stress conditions is altered. In other failure modes such as corrosion, only statistical predictions have been made [8].…”

Section: Introductionmentioning

confidence: 99%

A modeling framework for potential induced degradation in PV modules

et al. 2015

View full text Add to dashboard Cite

Major sources of performance degradation and failure in glass-encapsulated PV modules include moisture-induced gridline corrosion, potential-induced degradation (PID) of the cell, and stress-induced busbar delamination. Recent studies have shown that PV modules operating in damp heat at -600 V are vulnerable to large amounts of degradation, potentially up to 90% of the original power output within 200 hours. To improve module reliability and restore power production in the presence of PID and other failure mechanisms, a fundamental rethinking of accelerated testing is needed. This in turn will require an improved understanding of technology choices made early in development that impact failures later.In this work, we present an integrated approach of modeling, characterization, and validation to address these problems. A hierarchical modeling framework will allows us to clarify the mechanisms of corrosion, PID, and delamination. We will employ a physics-based compact model of the cell, topology of the electrode interconnection, geometry of the packaging stack, and environmental operating conditions to predict the current, voltage, temperature, and stress distributions in PV modules correlated with the acceleration of specific degradation modes. A self-consistent solution will capture the essential complexity of the technology-specific acceleration of PID and other degradation mechanisms as a function of illumination, ambient temperature, and relative humidity. Initial results from our model include specific lifetime predictions suitable for direct comparison with indoor and outdoor experiments, which are qualitatively validated by prior work. This approach could play a significant role in developing novel accelerated lifetime tests.

show abstract

Lifetime Estimation of a Photovoltaic Module Subjected to Corrosion Due to Damp Heat Testing

Cited by 45 publications

References 14 publications

Photovoltaic system lifetime prediction using Petri networks method

Photovoltaic system lifetime prediction using Petri networks method

Environmental aging in polycrystalline-Si photovoltaic modules: comparison of chamber-based accelerated degradation studies with field-test data

A modeling framework for potential induced degradation in PV modules

Contact Info

Product

Resources

About