“…This is because the minor carrier injection level under EL conditions is much lower than that under the PL conditions. Interestingly, for ZnO, although the radiative life time of defect related emissions is usually longer than that of FX emission, 27,28 the hole capture time of some defect centers, such as V ZnO , can be very much shorter than the life time of FX recombination. 27 As a result, when holes are injected whatever the mechanism, they will be quickly captured by such defect centers instead of directly recombining with electrons at the conduction band.…”