Leakage and Dynamic Glitch Power Minimization Using Integer Linear Programming for Vth Assignment and Path Balancing

Abstract

Abstract. This paper presents a novel technique, which uses integer linear programming (ILP) to minimize the leakage power in a dual-threshold static CMOS circuit by optimally placing high-threshold devices and simultaneously reduces the glitch power using the smallest number of delay elements to balance path delays. The constraint set size for the ILP model is linear in the circuit size. Experimental results show 96%, 40% and 70% reduction of leakage, dynamic and total power, respectively, for the benchmark circuit C7552 implemented in the 70nm BPTM CMOS technology.

Total Power Minimization in Glitch-Free CMOS Circuits Considering Process Variation

“…Hence, the deterministic approach of glitch elimination is not useful for power optimization with process variation. In the following section, we combine the MILP formulations introduced in [15][16][17], and thus a new statistical MILP formulation is proposed to optimize total power under process variation and to fully utilize the advantage of the glitch elimination procedure.…”

“…The deterministic MILP [15][16] using glitch elimination and dual-V th assignment to reduce the total power consumption is a prerequisite procedure, which is modified to consider process variation.…”

“…The objective function minimizes the impact of process variation on the total power consumption: It should be noticed that the solution provided by a deterministic MILP [15][16] gives us a rough idea of which one is the dominant component between leakage and dynamic power. We also get their exact optimal values (power consumption) for the optimized circuit.…”

“…P dyn_opt is the optimal dynamic power obtained by the deterministic MILP [15][16] and ρ is a constant determined by the process variation. By letting ρ larger than 1, the statistical MILP formulation can give an optimal circuit with less dynamic power.…”

“…Figure 6. Comparison of the impacts of 15% local L eff process variation on the leakage power in C432 which are optimized by the statistical MILP with the emphasis on the resistance of dynamic power to process variation, or the deterministic MILP [15][16]. (N1 and N2 are the normalized nominal leakage power in the optimized glitchfree C432).…”