2019
DOI: 10.1088/1361-6528/ab2d89
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Layered deposition of SnS2 grown by atomic layer deposition and its transport properties

Abstract: In this work, we report on the layered deposition of few-layer tin disulfide (SnS 2 ) using atomic layer deposition (ALD). By varying the ALD cycles it was possible to deposit poly-crystalline SnS 2 with small variation in layer numbers. Based on the ALD technique, we developed the process technology growing few-layer crystalline SnS 2 film (3-6 layers) and we investigated their electrical properties by fabricating bottom-gated thin film transistors using the ALD SnS 2 as the transport channel. SnS 2 devices s… Show more

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Cited by 19 publications
(22 citation statements)
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“…2020 [196] MoCl 5 + S(SiMe 3 ) 2 375 (800, S) (t)Au/Cr/Al 2 O 3 */MoS 2 */GaN 8 ML 3.5 (2-4) n 10 2 2019 [197] 300 (900, S) (t)Au/Cr/Al 2 O 3 */MoS 2 */sapphire 5 ML ≈3 (2.3-3.2) n ≈10 3 2019 [198] 350 (900, S) (t)Au/Cr/Al 2 O 3 */MoS 2 */sapphire 4 ML 0.56 d) 6.4 (≈3-10) e) n n >10 6 10 3 2020 [202] 400 (900, S) 2020 [199] 375 (800, inert) (+ 400, CS 2 ) 2017 [118] Mo 2017 [281] 155 (400, Ar + 500, S + 900, S) 2017 [241] 150 ( 2019 [242] 150 ( 2020 [70] Sn(dmamp) 2 + H 2 S plasma 150…”
Section: Field-effect Transistorsmentioning
confidence: 99%
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“…2020 [196] MoCl 5 + S(SiMe 3 ) 2 375 (800, S) (t)Au/Cr/Al 2 O 3 */MoS 2 */GaN 8 ML 3.5 (2-4) n 10 2 2019 [197] 300 (900, S) (t)Au/Cr/Al 2 O 3 */MoS 2 */sapphire 5 ML ≈3 (2.3-3.2) n ≈10 3 2019 [198] 350 (900, S) (t)Au/Cr/Al 2 O 3 */MoS 2 */sapphire 4 ML 0.56 d) 6.4 (≈3-10) e) n n >10 6 10 3 2020 [202] 400 (900, S) 2020 [199] 375 (800, inert) (+ 400, CS 2 ) 2017 [118] Mo 2017 [281] 155 (400, Ar + 500, S + 900, S) 2017 [241] 150 ( 2019 [242] 150 ( 2020 [70] Sn(dmamp) 2 + H 2 S plasma 150…”
Section: Field-effect Transistorsmentioning
confidence: 99%
“…k) Reproduced with permission. [242] Copyright 2019, IOP Publishing Ltd. The mobility values in parenthesis represent the device-to-device variation, if reported; d) 120 min annealing; e) 30 min annealing; f) SEt 2 pretreatment; g) No pretreatment; h) As-deposited; i) Annealed; j) Hole/electron (p-type/n-type) mobility.…”
Section: Field-effect Transistorsmentioning
confidence: 99%
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“…Aside from XRD characterization, we utilized Raman spectroscopy at 532 nm excitation wavelength ( Figure 2 c,d) to distinguish between two hexagonal configurations, 1T and 2H. Raman spectrum of SnS 2 reveals out-of-plane vibration mode A 1g at ~314 cm −1 and in-plane vibration of E g at ~205 cm −1 , corresponding to 1T polytype [ 44 , 49 , 50 ]. Similar to SnS 2 , SnSe 2 Raman spectrum has two characteristic phonon modes: A 1g mode at ~185 cm −1 and E g mode at ~116.5 cm −1 , associated with 1T-phase [ 36 , 51 ].…”
Section: Resultsmentioning
confidence: 99%