Abstract:On-Machine Measurement adoption will be key to dimensional and geometrical improvement of additively manufactured parts. One possible approach based on OMM aims at using digital images of manufactured layers to characterize actual contour deviations with respect to their theoretical profile. This strategy would also allow for in-process corrective actions. This work describes a layer-contour characterization procedure based on binarization of digital images acquired with a flat-bed scanner. This procedure has … Show more
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