Laue and Kossel Diffraction on Quasicrystals by Means of Synchrotron Radiation

Abstract

Laue experiments using synchrotron radiation have been carried out on quasicrystalline samples mainly with decagonal symmetry. Apart from Laue spots, Kossel lines and diffuse scattering have been observed on the X-ray film simultaneously. High spatial resolution was achieved by the positioning of the X-ray film at a distance of about 350 mm from the sample. Conclusions about the real structure and the crystal quality could be drawn using information obtained from the appearance of the Kossel lines, and the shape and the splitting of the Laue spots, respectively. The dimensions of the mosaic blocks and their tilting behaviour for one of the samples under investigation have been determined.

Spontaneous soft x-ray fluorescence from a superlattice under Kossel diffraction conditions

“…Similar observation has been made more recently using electron excitation in a superlattice, in fact a periodic multilayer [3,4]. The diffraction of the x-ray characteristic radiation produced inside a periodic structure by hard x-rays, electron or ion excitation is now known as Kossel diffraction [5,6]. It is being used mainly to study crystals and their defects [7].…”

Kossel Effect in Periodic Multilayers

“…This very first interpretation of X-ray diffraction given in 1912 by M. von Laue, was established about twenty years later by Kossel using electron excitation of a crystal, leading to the observation of the so-called Kossel lines. 2 Different ionizing radiations can be used to generate Kossel lines: 3 -electrons from an electron gun, 4-7 a scanning electron microscope 8 or a transmission electron microscope; 9 -X-ray photons from an X-ray tube, 10-12 a plasma source 13 or synchrotron radiation; [14][15][16][17][18] this case is analogous to the X-ray standing wave (XSW) technique 17 19 20 used to study the interfaces of multilayers 21 or X-ray waveguides 22 as well as thin surface films; 23 -rapid charged particles (proton or ion beam) from an accelerator. [24][25][26][27][28][29][30] In order to diffract X-rays the periodic medium can be a crystal 2 31 or a multilayer made of a periodic alternation of two or more nanometer-thick thin films.…”

Kossel interferences of proton-induced X-ray emission lines in periodic multilayers

“… Electrons from an electron gun [3][4][5][6] or a scanning electron microscope [7];  X-ray photons from an x-ray tube [8][9][10] or synchrotron radiation [11][12][13][14]; this case is analogous to the x-ray standing wave technique [14,15] used to study the interfaces of multilayers [16] or x-ray waveguides [17] as well as superficial thin films [18];  Rapid charged particles (proton or ion beam) from an accelerator [19][20][21][22][23][24][25].…”

“…The combination of the Kossel measurements and their simulation, will be a useful tool to obtain a good description of the multilayer stack and thus to study nanometer-thick layers and their interfaces.  X-ray photons from an x-ray tube [8][9][10] or synchrotron radiation [11][12][13][14]; this case is analogous to the x-ray standing wave technique [14,15] The technique requires a periodic structure to diffract the emitted radiation, thus it has been applied to study crystals and interferential multilayers. However, to the best of our knowledge, Kossel lines have never been observed in multilayers upon particle excitation.…”