2002
DOI: 10.1006/jcis.2002.8640
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Latex Film Morphology and Electrical Potential Pattern Dependence on Serum Components: A Scanning Probe Microscopy Study

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Cited by 13 publications
(8 citation statements)
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References 32 publications
(25 reference statements)
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“…The tip apex radius was 28 ± 10 nm, the spring constant 0.5-4.4 N m -1 and the resonance frequency was 45-95 kHz. In air, the images were generated by varying, in the same region, the tip voltage (±1.5 V and ± 3 V) and, for each voltage, the lift height (20,30,40 and 50 nm). For the experiments in N 2 , EFM was carried out using a ±1.5 V tip voltage and a life height of 400 nm.…”
Section: Characterizationmentioning
confidence: 99%
“…The tip apex radius was 28 ± 10 nm, the spring constant 0.5-4.4 N m -1 and the resonance frequency was 45-95 kHz. In air, the images were generated by varying, in the same region, the tip voltage (±1.5 V and ± 3 V) and, for each voltage, the lift height (20,30,40 and 50 nm). For the experiments in N 2 , EFM was carried out using a ±1.5 V tip voltage and a life height of 400 nm.…”
Section: Characterizationmentioning
confidence: 99%
“…One might speculate that the local microstructural environment of the water is important for determining whether water can penetrate through a coating to cause substrate corrosion or degradation or whether it remains trapped in isolated pockets within the bulk of the coating or is bound within the polymer phase. When coatings are exposed to water, there are also changes to their microstructures and the growth of water “bubbles” that have been observed with electron microscopy …”
Section: Introductionmentioning
confidence: 98%
“…However, the majority of published work using these techniques has been done on semiconductors or metals. This laboratory used this technique for the examination of dielectric solids, specially those made out of colloid polymers or latexes. The association between SEPM and analytical electron microscopy (electron energy-loss spectroscopy in the transmission electron microscope, EELS-TEM) allowed the unequivocal identification of polymer charge carriers with ionic constituents such as K + and RSO 4 - ions introduced during the polymerization process. , …”
Section: Introductionmentioning
confidence: 99%
“…This laboratory used this technique for the examination of dielectric solids, specially those made out of colloid polymers or latexes. [15][16][17][18] The association between SEPM and analytical electron microscopy (electron energy-loss spectroscopy in the transmission electron microscope, EELS-TEM) allowed the unequivocal identification of polymer charge carriers with ionic constituents such as K + and RSO 4ions introduced during the polymerization process. 19,20 However, charge patterns were also identified in many thermoplastics that do not contain ionic constituents introduced during the synthesis, thus showing that other types of charge carriers should be considered.…”
Section: Introductionmentioning
confidence: 99%