Lateral shift mapping metrology for X-ray telescope mirrors

Wisniewski, Hayden; Whalen, Mallory; Heilmann, Ralf K.; Schattenburg, Mark L.; Chalifoux, Brandon D.

doi:10.1117/12.2594275

Cited by 2 publications

(1 citation statement)

References 8 publications

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“…We previously demonstrated our ability to extract single line traces of flat mirrors. 17,18 We now show how we expand this self referencing metrology technique to the axial direction for cylindrical systems. Unlike the method presented by Bloemhof, this will only require a shift along the axial direction of the mirror.…”

Section: Shift Mappingmentioning

confidence: 99%

Absolute surface metrology of x-ray telescope mirrors through axial shift mapping

Wisniewski,

Heilmann,

Schattenburg

et al. 2023

Optics for EUV, X-Ray, and Gamma-Ray Astronomy XI

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The next generation of x-ray telescopes will require mirror segments to be characterized to a surface uncertainty of 5 nm RMS or better. We present axial shift mapping, a Fizeau interferometry method to characterized near-cylindrical null correctors and surfaces. We extend our previously tested technique to cylindrical optics of similar dimensions to x-ray telescope mirrors. We report on progress towards full surface extraction of a cylindrical optic using axial shift mapping.

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Section: Shift Mappingmentioning

confidence: 99%

Absolute surface metrology of x-ray telescope mirrors through axial shift mapping

Wisniewski,

Heilmann,

Schattenburg

et al. 2023

Optics for EUV, X-Ray, and Gamma-Ray Astronomy XI

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Stitching interferometry for long X-ray mirrors with lateral multi-shift-based absolute calibration

Zhou,

Wang,

Lei

et al. 2024

Appl. Opt.

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To eliminate the reference mirror (REF) error of the Fizeau interferometer for measuring X-ray mirrors, the reference calibration method of lateral multi-shift measurements at the hundreds-micrometer pixel level is presented. Because of the high aspect ratio of long X-ray mirrors, by shifting the surface under test (SUT) along the tangential direction with integer multiple pixels, we extend the calibration method by using the difference between multiple shifted measurements to build an augmented multi-matrix for extracting the two-dimensional (2D) absolute surface. The method can be applied to arbitrary measurement regions of the test optics, and the measurement for both the benchmark sub-aperture and calibration of the REF is accomplished in a single measuring process. Furthermore, by adjusting the shift to the millimeter scale, reference-subtracted sub-apertures can be stitched to obtain the absolute 2D map of the X-ray mirror. Experimental results show that all the 2D discrepancies reach sub-nanometer repeatability, and comparison results between the long trace profiler (LTP) and the proposed method have been performed. Therefore, the results demonstrated that the proposed method meets the requirements of X-ray mirror measurements.

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Lateral shift mapping metrology for X-ray telescope mirrors

Cited by 2 publications

References 8 publications

Absolute surface metrology of x-ray telescope mirrors through axial shift mapping

Absolute surface metrology of x-ray telescope mirrors through axial shift mapping

Stitching interferometry for long X-ray mirrors with lateral multi-shift-based absolute calibration

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