Lateral inhomogeneities in engineered Schottky barriers

Heun, S.; Schmidt, Th.; Slezák, J.; Dı́az, J.; Müller, Bernhard; Franciosi, A.

doi:10.1016/s0022-0248(98)01472-9

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Laterally Resolved Pes With a Peem1

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Cited by 7 publications

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“…Other examples of application of the SPELEEM to problems of practical relevance include the measurement of lateral inhomogeneities in Schottky barriers [55], the surface diffusion of Au on Si(111) [56], the growth of thin metal films [43], and the study of liquid Au-Si droplets near to the eutectic point [57].…”

Section: Laterally Resolved Pes With a Peemmentioning

confidence: 99%