Laser thermal effects on atomic force microscope cantilevers

Allegrini, M.; Ascoli, C.; Baschieri, P.; Dinelli, Franco; Frediani, C.; Lio, Anna; Mariani, Tullio

doi:10.1016/0304-3991(92)90295-u

Cited by 50 publications

(34 citation statements)

References 23 publications

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“…The four-quadrant photodiode ͑Advanced Photonix SD 055-23͒ senses both the vertical bending and the torsion of the cantilever. This type of detection system has proved to be sensitive and reliable [10][11][12][13] and, in the present work, it is treated as a reference. Its main disadvantage comes from the great number and size of the components required and their bulky packing close to the cantilever leaving almost no room for the simultaneous use of other auxiliary inspection instruments.…”

Section: Methodsmentioning

confidence: 98%

Monitoring of an atomic force microscope cantilever with a compact disk pickup

Quercioli

Tiribilli

Ascoli

et al. 1999

Review of Scientific Instruments

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In the present study we test a compact disk pickup as the cantilever position sensor in an atomic force microscope (AFM). The pickup is placed on top of the optical microscope used for the visual inspection and alignment of the specimen. The AFM is also equipped with its own cantilever movement sensor system. Both the built-in and the new detection devices are simultaneously active for comparison purposes. Two different measurements are performed in sequence on the same sample each using one sensor at a time as the error signal source for the AFM feedback loop. The pickup has demonstrated good sensitivity as well as excellent performance in terms of compactness, reliability, and cost.

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Section: Methodsmentioning

confidence: 98%

Monitoring of an atomic force microscope cantilever with a compact disk pickup

Quercioli

Tiribilli

Ascoli

et al. 1999

Review of Scientific Instruments

Self Cite

View full text Add to dashboard Cite

show abstract

“…For cantilever based systems, the influence of the beam-bounce laser cannot be ignored as it can itself affect the cantilever deflection [37,38]. In one report, a 100 μW laser caused the commercial uncoated probe studied to deflect by 30 nm when excited from one side as in a typical beam-bounce configuration whereas the standard metal coated probe deflected over 3 μm [37].…”

Section: Indirect Effects Of Optical Fieldsmentioning

confidence: 99%

Optically induced forces in scanning probe microscopy

et al. 2014

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Typical measurements of light in the near-field utilize a photodetector such as a photomultiplier tube or a photodiode, which is placed remotely from the region under test. This kind of detection has many draw-backs including the necessity to detect light in the far-field, the influence of background propagating radiation, the relatively narrowband operation of photodetectors which complicates the operation over a wide wavelength range, and the difficulty in detecting radiation in the far-IR and THz. Here we review an alternative near-field light measurement technique based on the detection of optically induced forces acting on the scanning probe. This type of detection overcomes some of the above limitations, permitting true broad-band detection of light directly in the near-field with a single detector. The physical origins and the main characteristics of optical force detection are reviewed. In addition, intrinsic effects of the inherent optical forces for certain operation modalities of scanning probe microscopy are discussed. Finally, we review practical applications of optical force detection of interest for the broader field of the scanning probe microscopy.

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“…8,9,[12][13][14][15][16][17][18][19][20][21][22][23] Microcantilever deflections resulting from changes in temperature have been observed and reported by many researchers. 8,9,13,[19][20][21][22] In some cases, [19][20][21][22] the bending of the microcantilever was due to heating from the diode laser beam used in atomic force microscopy ͑AFM͒ optical detection systems. Recent studies 8,[13][14][15][16] have reported the use of microcantilever bending for calorimetric detection of chemical reactions with energies as low as a few pJ.…”

mentioning

confidence: 96%

Remote infrared radiation detection using piezoresistive microcantilevers

Datskos

Oden

Thundat

et al. 1996

Applied Physics Letters

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A novel micromechanical infrared (IR) radiation sensor has been developed using commercially available piezoresistive microcantilevers. Microcantilevers coated with a heat absorbing layer undergo bending due to the differential stress between the top layer (coating) and the substrate. The bending causes a change in the piezoresistance and is proportional to the amount of heat absorbed. The microcantilever IR sensor exhibits two distinct thermal responses: a fast one (<ms) and a slower one (∼10 ms). A noise equivalent power (at a modulation frequency of 30 Hz) was estimated to be ∼70 nW/Hz1/2. This value can be further reduced by designing microcantilevers with better thermal isolation that can allow microcantilevers to be used as uncooled IR radiation detectors.

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Laser thermal effects on atomic force microscope cantilevers

Cited by 50 publications

References 23 publications

Monitoring of an atomic force microscope cantilever with a compact disk pickup

Monitoring of an atomic force microscope cantilever with a compact disk pickup

Optically induced forces in scanning probe microscopy

Remote infrared radiation detection using piezoresistive microcantilevers

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