PACS 72.20.Jv, 72.80.Ey Photomagnetoelectric (PME) effect of high resistivity CdTe and CdZnTe for nuclear detector applications is measured. Ambipolar diffusion lengths of 9 µm and 25 µm for CdTe and CdZnTe respectively are obtained at room temperature. From the temperature dependence of PME short circuit current measurements, a peak at T = 240 K is found for THM CdTe when the excitation light is chopped at the frequency of 135 Hz. The behaviour is explained by the reemission of trapped carrier at the recombination centre by optical excitation.1 Introduction A unipolar transport of electrons and holes under applied electric field is often reported for high-resistivity CdTe and CdZnTe, since the performance of their important application, room temperature radiation detector, is predominantly determined by the transport of the carriers under similar circumstances. In the aspect, a time-of-flight (TOF) measurement is an ideal method to asses the mobility of those materials. The method is also utilized for carrier lifetime measurements, providing that the lifetime and the transit time of the carriers are in the same range. However, as a result of recent improvement in the crystal growth technique, the carrier lifetime for detector grade materials is too long to be measured accurately by the method. In fact, a µτ-product measured by this method tends to give a smaller value as compared with that measured by other methods [1]. A photomagnetoelectric (PME) measurement is a static approach to investigate the ambipolar transport of semiconductor materials. The trap concentration and the carrier lifetime of semi-insulating GaAs:Cr has been reported from the intensity dependence of PME short circuit current combined with photoconductance measurements [2]. We attempt to utilize the temperature dependence of PME to investigate the carrier transport properties of CdTe and CdZnTe for nuclear detector applications.