This letter introduces a localized microwave technique for direct excitation of solid materials for the sake of their identification by atomic emission spectroscopy. The microwave energy is concentrated on the material surface by a microwave‐drill type applicator. The evolved ∼1‐mm3 hotspot is slightly evaporated and excited as plasma. An optical spectrometer measures the atomic emission spectrum, hence enabling the material identification as in the known laser‐induced breakdown spectroscopy (LIBS) technique. The experimental results demonstrate the conceptual feasibility of the localized microwave‐induced breakdown spectroscopy as a low‐cost substitute for the laser‐based LIBS for material identification in scenarios in which a direct contact with the material to be identified and its slight destruction are permitted. © 2011 Wiley Periodicals, Inc. Microwave Opt Technol Lett 53:2281–2283, 2011; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.26272