Laser and microwave induced breakdown spectroscopy: basis for a new detection technique for chemical and biological agents

Kiel, Johnathan L.; Rockwell, Benjamin A.; Sutter, R.; Williams, James A.; Hardin, D. Barrett; Morales, Pedro Jorge Cortes; Eikum, Debbie M.; Thomas, R.; Noojin, Gary D.; Alls, John L.

doi:10.1109/ppps.2001.1002032

Cited by 2 publications

(3 citation statements)

References 3 publications

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“…Microwaves have been used so far volumetrically for microwave‐induced breakdown spectroscopy (MIBS) measurements in gases (e.g. [4–6]) and for assisting LIBS [7]. Here we present a MIBS technique for solids and liquids, using localized microwaves directly on the material surface.…”

Section: Introductionmentioning

confidence: 99%

Breakdown spectroscopy induced by localized microwaves for material identification

Meir

Jerby

2011

Micro & Optical Tech Letters

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This letter introduces a localized microwave technique for direct excitation of solid materials for the sake of their identification by atomic emission spectroscopy. The microwave energy is concentrated on the material surface by a microwave‐drill type applicator. The evolved ∼1‐mm3 hotspot is slightly evaporated and excited as plasma. An optical spectrometer measures the atomic emission spectrum, hence enabling the material identification as in the known laser‐induced breakdown spectroscopy (LIBS) technique. The experimental results demonstrate the conceptual feasibility of the localized microwave‐induced breakdown spectroscopy as a low‐cost substitute for the laser‐based LIBS for material identification in scenarios in which a direct contact with the material to be identified and its slight destruction are permitted. © 2011 Wiley Periodicals, Inc. Microwave Opt Technol Lett 53:2281–2283, 2011; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.26272

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Section: Introductionmentioning

confidence: 99%

Breakdown spectroscopy induced by localized microwaves for material identification

Meir

Jerby

2011

Micro & Optical Tech Letters

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“…Microwaves have been used so far volumetrically for microwave-induced breakdown spectroscopy (MIBS) measurements in gases (e.g. [4][5][6]) and for assisting LIBS [7]. Here we present a MIBS technique for solids and liquids, using localized microwaves directly on the material surface.…”

Section: Introductionmentioning

confidence: 99%

“…The design of efficient and small size antennas for wideband applications is still a major challenge. Many different designs of UWB antennas have been studied [2][3][4][5][6][7][8][9][10][11][12][13][14]. Some used the monopole configuration such as square, annual ring, triangle, elliptical, pentagon, and hexagonal antennas [2][3][4][5][6][7][8][9][10] and others used the dipole configuration like bow-tie antennas [11][12][13][14].…”

Section: Introductionmentioning

confidence: 99%

Intermodulation Distortion Analysis of MESFET Amplifiers Using the Volterra Series Representation

Minasian

1980

IEEE Trans. Microwave Theory Techn.

109

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This letter introduces a localized microwave technique for direct excitation of solid materials for the sake of their identification by atomic emission spectroscopy. The microwave energy is concentrated on the material surface by a microwave-drill type applicator. The evolved $1-mm 3 hotspot is slightly evaporated and excited as plasma. An optical spectrometer measures the atomic emission spectrum, hence enabling the material identification as in the known laser-induced breakdown spectroscopy (LIBS) technique. The experimental results demonstrate the conceptual feasibility of the localized microwaveinduced breakdown spectroscopy as a low-cost substitute for the laserbased LIBS for material identification in scenarios in which a direct contact with the material to be identified and its slight destruction are permitted.

show abstract

Laser and microwave induced breakdown spectroscopy: basis for a new detection technique for chemical and biological agents

Cited by 2 publications

References 3 publications

Breakdown spectroscopy induced by localized microwaves for material identification

Breakdown spectroscopy induced by localized microwaves for material identification

Intermodulation Distortion Analysis of MESFET Amplifiers Using the Volterra Series Representation

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