2003
DOI: 10.1063/1.1622440
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Large room-temperature spin-dependent tunneling magnetoresistance in polycrystalline Fe3O4 films

Abstract: Polycrystalline Fe3O4 films have been prepared by reactive sputtering at room temperature. Transmission electron microscopy images show that the films consist of quite uniform Fe3O4 grains well separated by grain boundaries. It was found that the tunneling of spin-polarized electrons across the antiferromagnetic coupled grain boundaries dominates the transport properties of the films. Magnetoresistance (MR) {=[ρ(H)−ρ(0)]/ρ(0)} shows linear and quadratic magnetic-field dependence in the low-field range when the… Show more

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Cited by 101 publications
(72 citation statements)
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“…At low field, the MR is linear and parabolic dependent on the angle between the applied field and the sample surface, as typically observed in thin Fe 3 O 4 granular films [7]. This different low-field behaviour is due to the different scattering probability for the tunnelling electrons when the grain magnetizations are parallel or perpendicular to the film plane [41].…”
Section: Atomic Scale Characterization and Magnetotransport Propertiementioning
confidence: 75%
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“…At low field, the MR is linear and parabolic dependent on the angle between the applied field and the sample surface, as typically observed in thin Fe 3 O 4 granular films [7]. This different low-field behaviour is due to the different scattering probability for the tunnelling electrons when the grain magnetizations are parallel or perpendicular to the film plane [41].…”
Section: Atomic Scale Characterization and Magnetotransport Propertiementioning
confidence: 75%
“…show the sharp change of resistivity typically seen in bulk magnetite at the Vervey transition temperature (120 K). The broadening (sometimes disappearance) of the Verwey transition has been previously observed in polycrystalline magnetite thin films produced by magnetron sputtering [7,15,[34][35][36][37]. The reason for the broadening/disappearance of the Verwey transition is often attributed to cation deficiency (i.e.…”
Section: Atomic Scale Characterization and Magnetotransport Propertiementioning
confidence: 97%
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“…The 3 nm film shows similar tendencies except for higher resistivity and disappearance of the T v , which implies that the transport property of 3 nm Fe 3 O 4 film is grain-boundary controlled. [26][27][28] We replot the temperature dependence of resistivity as log ρ − T −1/2 , shown in the bottom panel of Fig. 4(c).…”
mentioning
confidence: 99%