2007
DOI: 10.1016/j.actamat.2007.02.004
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Large magnetoresistance observed in facing-target sputtered Ni-doped CNx amorphous composite films

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Cited by 16 publications
(6 citation statements)
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“…Therefore, metal loading is a feasible method to improve catalytic efficiency. Besides, metal loading can improve other properties of g-C3N4 (such as permeability) [17].…”
Section: Preparation Properties and Photocatalytic Study Of Metal-supported G-c3n4mentioning
confidence: 99%
“…Therefore, metal loading is a feasible method to improve catalytic efficiency. Besides, metal loading can improve other properties of g-C3N4 (such as permeability) [17].…”
Section: Preparation Properties and Photocatalytic Study Of Metal-supported G-c3n4mentioning
confidence: 99%
“…However, the observed ferromagnetism is weak and the Curie temperature is often below room temperature. Recently, the interesting magnetoresistance has been observed in the magnetic element added disordered oxide semiconductors with large dopant concentrations, such as FeeIn 2 O 3 [22], CoeZnO [23], NieCN [24], CoeTiO 2 [23,25], and FeeTieO [26].…”
Section: Introductionmentioning
confidence: 99%
“…13,14) In our previous work, a large negative MR ($59%) was observed in the amorphous Ni-CN x films, 15,16) which was attributed to a spin-related high-order tunneling process with a spin polarization of P ¼ P 0 expðÀT Þ, where P 0 is the spin polarization of the ferromagnetic metal at 0 K, T is the temperature and , are the coefficients. 15,16) It is known that the band gap of CN x can be changed in a wide range of 0-3 eV, 17) so the interface between the amorphous Ni-CN x and Si wafer should be different from that in the ferromagnetic metal/SC heterostructures. Thus, it is interesting to investigate its electronic transport properties across the interface.…”
mentioning
confidence: 94%
“…XPS results show that the Ni-CN x layer is composed of metallic Ni, Ni carbides and/or Ni nitrides, and carbon nitrides. 15,16) Figure 2(a) shows the current-to-voltage (I-V ) curves of the amorphous Ni-CN x /p-Si heterostructure. The top-left inset of Fig.…”
mentioning
confidence: 99%