2018
DOI: 10.1039/c8nr03616k
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Large birefringence and linear dichroism in TiS3 nanosheets

Abstract: TiS3 nanosheets have proven to be promising candidates for ultrathin optoelectronic devices due to their direct narrow band-gap and the strong light-matter interaction. In addition, the marked in-plane anisotropy of TiS3 is appealing for the fabrication of polarization sensitive optoelectronic devices. Herein, we study the optical contrast of TiS3 nanosheets of variable thickness on SiO2/Si substrates, from which we obtain the complex refractive index in the visible spectrum. We find that TiS3 exhibits very la… Show more

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Cited by 47 publications
(57 citation statements)
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References 42 publications
(44 reference statements)
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“…The direct comparison between the AFM and the optical images allows us to build up a color-chart correlating the apparent color of the MoO 3 flakes deposited on top of the 297 nm SiO 2 /Si substrate (the SiO 2 thickness is experimentally measured by reflectometry with ±0.5 nm uncertainty) with their corresponding thickness with an uncertainty of ±3 nm. Similar approaches have been reported for graphene [ 45 ], transition metal dichalcogenides [ 46 ], TiS 3 [ 47 ] and franckeite [ 48 ]. This method has the main limitation that it requires the use of a specific SiO 2 thickness as the interference colors of the MoO 3 flakes strongly depend on the underlying substrate.…”
Section: Resultssupporting
confidence: 75%
“…The direct comparison between the AFM and the optical images allows us to build up a color-chart correlating the apparent color of the MoO 3 flakes deposited on top of the 297 nm SiO 2 /Si substrate (the SiO 2 thickness is experimentally measured by reflectometry with ±0.5 nm uncertainty) with their corresponding thickness with an uncertainty of ±3 nm. Similar approaches have been reported for graphene [ 45 ], transition metal dichalcogenides [ 46 ], TiS 3 [ 47 ] and franckeite [ 48 ]. This method has the main limitation that it requires the use of a specific SiO 2 thickness as the interference colors of the MoO 3 flakes strongly depend on the underlying substrate.…”
Section: Resultssupporting
confidence: 75%
“…This result indicates that both TiS 3 and ZrS 3 have inplane optical anisotropy properties, which is consistent with the previous and experimental results. [13][14][15][16] In this work, the electronic and optical properties were computed by using first-principles methods, which are programmed in Vienna ab initio simulation package. [28][29][30][31] The electron exchange-correlation is treated with generalized gradient approximation of Perdew-Burke-Ernzerhof.…”
Section: Crystal Structure and Density Functional Theory Calculationsmentioning
confidence: 99%
“…[6] Among all kinds of optical anisotropic materials, transition metals trichalcogenides (TMTC) materials have attracted more attention due to their unique crystal structure, optical properties and electrical properties. [7][8][9][10][11][12][13][14][15] Among the numerous TMTC materials, there is a material system MS 3 (M = Ti, Zr, Hf) the transition metal element as the IVB group element, and the ratio of transition metal element to sulfur element is 1:3. MS 3 bulk materials are wire-like crystals, and the mono-layered materials obtained by mechanically separated are nanoribbons with quasi-1D structure.…”
Section: Introductionmentioning
confidence: 99%
“…It is well known that graphene, transition metal dichalcogenides (TMDCs), TiS 3 , franckeite, mica, antimonene and MoO 3 flakes deposited on a SiO 2 /Si substrate present different colors depending on their thickness and on the SiO 2 thickness. [16,[49][50][51][52][53][54] A comprehensive analysis of the apparent colors can yield a quick guide to estimate the thickness of 2D materials in a similar fashion as the thickness of SiO 2 capping layers on Si wafers is estimated from its interference color. Figure 2a shows the AFM topography of seven InSe flakes with thicknesses ranging from %4 to %90 nm, and Figure 2b shows their corresponding optical microscopy images on 270 nm SiO 2 /Si substrate (the SiO 2 thickness has been experimentally determined by reflectometry with AE0.5 nm uncertainty).…”
Section: Apparent Colormentioning
confidence: 99%