“…[ 5 , 6 ]. The diffuse scattering method is also used to study the effect of various growth parameters on the real structure of single crystals [ 7 ]. At the same time, studies of changes in a microdefect structure using the X-ray diffuse scattering method under the influence of sufficiently weak external actions, such as the external electric field application, propagation of acoustic waves, and elastic deformation, have not been carried out.…”