2004
DOI: 10.1118/1.1713298
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Lag measurement in an active matrix flat‐panel imager

Abstract: Lag and residual contrast have been quantified in an amorphous selenium (a-Se) active-matrix flat-panel imager (AMFPI) as a function of frame time, kilovoltage (kV) and megavoltage (MV) x-ray photon energies and amount of radiation incident on the detector. The AMFPI contains a 200 microm thick a-Se layer deposited on a thin film transistor (TFT) array of size 8.7 cm x 8.7 cm with an 85-microm pixel pitch. For all energies, the lag (signal normalized to the signal due to exposure) for the first (n = 1) and sec… Show more

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Cited by 17 publications
(13 citation statements)
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References 30 publications
(35 reference statements)
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“…Ghosting artifacts have been described by Siewerdsen et al 45,46 for an indirect detection active matrix flat panel detector due to signal lag, and in direct detection active matrix flat panel detectors due probably to space charge effects by several others. 47,48 Ghosting occurs when sensitivity reduction and recovery processes have time constant of the order of reading cycle of the detector. In the imaging experi-ments, the dose delivered to the CdWO 4 array is expected to be less than 10 cGy.…”
Section: Discussionmentioning
confidence: 99%
“…Ghosting artifacts have been described by Siewerdsen et al 45,46 for an indirect detection active matrix flat panel detector due to signal lag, and in direct detection active matrix flat panel detectors due probably to space charge effects by several others. 47,48 Ghosting occurs when sensitivity reduction and recovery processes have time constant of the order of reading cycle of the detector. In the imaging experi-ments, the dose delivered to the CdWO 4 array is expected to be less than 10 cGy.…”
Section: Discussionmentioning
confidence: 99%
“…[17][18][19][20]25,31 Image lag is defined as residual signal, i.e., the carryover of trapped charge into subsequent frames acquired with no exposure. With regard to amorphous silicon detectors, the dominant source of image lag has been identified as trapping and release of charge in the sensor elements.…”
Section: Ivb Ghostingmentioning
confidence: 99%
“…29 Much research has been performed to experimentally study the image lag using pulse or step response functions. [28][29][30][31][32][33] Recently, we reported a new static grid-based technique to achieve combined scatter reduction and correction. 34 Specifically, the method uses a 1D preobject grid to directly reduce the scatter and simultaneously measure the remaining scatter for postscan scatter correction.…”
Section: Introductionmentioning
confidence: 99%