Laboratory Techniques for X-ray Reflection Topography

Armstrong, R.D.

doi:10.1007/978-1-4757-1126-4_14

Cited by 35 publications

(2 citation statements)

References 20 publications

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“…Thus, it has been shown that X-ray topographs made with Kossel lines can provide information on the tilt angles of subgrains in imperfect single crystals. Further work is in progress on the angular resolution and spatial resolution of this method of X-ray topography, on the possible observation of local strain and other types of defects, on the nature of the subgrain boundaries as indicated by the intensity profiles and on the use of this technique for the formation of stereo pairs using techniques similar to those described by Armstrong (1980).…”

Section: Discussionmentioning

confidence: 99%

Angle-sensitive X-ray topographs obtained with Kossel lines

Wittry¹,

Sun²,

Chang³

1991

J Appl Cryst

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A simple method and simple camera of small size for obtaining X-ray topographs with a microfocus X-ray source are described and initial results and their interpretation are given for an LiF crystal. The method is based on scanning a Kossel line across the recording film by simultaneously translating the crystal and film relative to the source and to a stationary mask that blocks most of the scattered and fluorescence radiation. The mask, which is located between the specimen and the film, is made by using the Kossel line recorded on a film in the mask plane as a pattern; this provides self-alignment of the system. Theoretical calculations are given that indicate the potential angular resolution of the method when applied to nearly perfect crystals. The advantages of this method over similar methods using the X-ray continuum diverging from a point source are discussed.

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Section: Discussionmentioning

confidence: 99%

Angle-sensitive X-ray topographs obtained with Kossel lines

Wittry¹,

Sun²,

Chang³

1991

J Appl Cryst

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“…The extinction distances ξ g and the full width at half maximum (FWHM values), θ 1/2 , of the rocking curves were calculated according to the description given by Armstrong [17], who discussed extinction and orientation contrast effects in x-ray reflection topography, mainly based on the dynamical theory of x-ray diffraction [18,19]. The structure factors used in table 1 were calculated using the atomic coordinates provided in [20].…”

Section: High Spatial Resolution Multiple-crystal Topographymentioning

confidence: 99%

Periodic domain inversion in poled via high-resolution x-ray topography and diffraction-space mapping

Thomas

Risk

1996

J. Phys. D: Appl. Phys.

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Periodic domain inversion produced by electron beam writing on the face of a hydrothermally grown crystal has been investigated by high-resolution multiple-crystal topography and diffraction-space mapping. Periodic contrast, with spacings which are consistent with the lateral dimensions of the inversion domains, has been observed by choosing a high spatial resolution mode for topography. Via reciprocal-space mapping, the scattering features along and have been extracted and shown, by combination with high angular resolution topography, to relate to the lattice tilting and strain induced during the domain inversion process. The origins of the diffraction contrast in the domain inverted regions, and the factors affecting the diffraction images of the domains are discussed.

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LM-ACT for Imaging RAM Devices in X-Ray Diffraction Topographs

Beard¹,

Armstrong²

1989

Advances in X-Ray Analysis

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Laboratory Techniques for X-ray Reflection Topography

Cited by 35 publications

References 20 publications

Angle-sensitive X-ray topographs obtained with Kossel lines

Angle-sensitive X-ray topographs obtained with Kossel lines

Periodic domain inversion in poled via high-resolution x-ray topography and diffraction-space mapping

LM-ACT for Imaging RAM Devices in X-Ray Diffraction Topographs

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