1999
DOI: 10.1107/s0909049599001879
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Laboratory diffractometer-based XAFS spectrometer

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Cited by 13 publications
(6 citation statements)
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“…By contrast, and with only rare exceptions in the last 20 years, 'routine' hard x-ray XAFS [49][50][51][52][53][54][55][56][57][58][59][60][61][62][63][64] and high-resolution XES [65][66][67][68][69][70] can only be performed at the synchrotron light sources.…”
Section: Introductionmentioning
confidence: 99%
“…By contrast, and with only rare exceptions in the last 20 years, 'routine' hard x-ray XAFS [49][50][51][52][53][54][55][56][57][58][59][60][61][62][63][64] and high-resolution XES [65][66][67][68][69][70] can only be performed at the synchrotron light sources.…”
Section: Introductionmentioning
confidence: 99%
“…In the photographs obtained by dye method, the palm yellow or red zone represents the constituent of ferrite, the blue represents the carbide-free bainite, and the white represents the retained austenite or martensite because they are difficult to be etched. The volume fraction of retained austenite also determines by X-ray diffractometer with the diffraction peak integral intensity of {220},{311} crystal plane ( Ref 14,15). The conversion ratio X can be calculated by…”
Section: Methodsmentioning
confidence: 99%
“…EXAFS measurements of the Cu K- and Se K-edges were carried out with a laboratory XAFS spectrometer (Shuvaev et al , 1999) with X-ray tube BSV29-Ag (17 kV, 30 mA). A focusing SiO 2 (13 0) d=1.1806 Å for Cu K-edge and SiO 2 (1230) d=0.805 Å for Se K-edge crystal monochromators were used.…”
Section: Methodsmentioning
confidence: 99%