“…The microscope technology based on interference imaging of complex linear scattered fields has made tremendous progress in the past two decades. Several schemes have been demonstrated for phase-sensitive imaging and detection, including but not limited to the interferometric scattering microscopy (iSCAT), − coherent brightfield microscopy (COBRI), − spatial light interference microscopy (SLIM), − interferometric reflectance imaging sensor (IRIS), − rotating coherent scattering microscopy (ROCS), , digital holographic microscopy (DHM), diffraction phase microscopy (DPM), , optical diffraction tomography (ODT, also known as tomographic phase microscopy), − Fourier ptychographic microscopy (FPM), , partial-wave spectroscopic microscopy (PWS), , and quantitative DIC microscopy . These various techniques share a common working principle, that is to detect the complex signal fields through interference.…”