2017
DOI: 10.1117/12.2258230
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Lab- and field-test results of MFIG, the first real-time vacuum-contamination sensor

Abstract: To produce high-end semiconductor products, clean vacuum is often required. Even small amounts of high-mass molecules can reduce product yield. The challenge is to timely detect the presence of relevant contaminants. This is where MFIG can help. The mass-filtered ion gauge sensor (MFIG) continuously and selectively monitors the presence of high-mass contaminant molecules with a sensitivity down to 1E-13 mbar at total pressures up to 1E-5 mbar.This contribution presents laboratory and field-test data to demonst… Show more

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“…A mass filtered ion gauge (MFIG, Figure 1) [1] is a metrology tool for detecting low levels of contamination [volatile organic compounds (VOC) and airborne molecular contamination (AMC)]. MFIG can detect "short" bursts (1 s time resolution) of contamination starting from a selectable mass.…”
Section: Introductionmentioning
confidence: 99%
“…A mass filtered ion gauge (MFIG, Figure 1) [1] is a metrology tool for detecting low levels of contamination [volatile organic compounds (VOC) and airborne molecular contamination (AMC)]. MFIG can detect "short" bursts (1 s time resolution) of contamination starting from a selectable mass.…”
Section: Introductionmentioning
confidence: 99%