Ga 0.5 B 0.5 TiO 4 (B = Nb, Ta) ceramics with Rutile structure were prepared through a mixed oxide solid state sintering route and characterized using X-ray diffraction and Raman spectroscopy. Structural analysis revealed a tetragonal (P42/mnm) symmetry for both the compounds. The sintered microstructure of Ga 0.5 Nb 0.5 TiO 4 (GNT) sample comprised faceted polygons while that of Ga 0.5 Ta 0.5 TiO 4 (GTT) comprised well connected irregularshaped grains. Both the GNT and GTT samples exhibited promising relative permittivities (e r = 54.9 and 40.6) and quality factors (Q u 9 f o = 16,565 and 17,522 GHz) respectively; however, further investigations are needed to tune their temperature coefficient of resonant frequency (s f = 164.5 and 110.7 ppm/°C) through zero.