The phase plane deconvolutlon method allows a rapld determlnation of the lifetimes of emlttlng electronically exclted states In the case of single exponentlal decays. We demonstrate that the phase plane method Is also suitable for more complex decays, when there Is a scattered light component or the sample exhibits a decay which Is ai sum of two exponentlals. Under these conditions, this technique Is very useful for the rapid determlnatlon of the parameters of the decays; In partlcular, It Is useful with mini-or mbrocomputers.with the following initial condition: u(0) = 0.By puttingrelationship 6 can be rewritten in the simpler form 1 (8)Relationship 8 can be rewritten as An important problem in many scientific fields is to extract the maximum information from the result of an experimental measurement. In particular, the accurate measurement offluorescence decays, obtained via the single photon counting technique, is crucial in the field of spectroscopy, chemical kinetics, analysis, photochemistry, and photophysics. In practice, the continuous fluorescence response function, u(t), is significantly distorted by the real time profile of the excitating flash, f ( t ) , and by the response function of the electronics, e(t). If z ( t ) is the real fluorescence time profile of the system exicited by a Dirac pulse, then we have the convolution product (eq 1) (the definitions of symbols appear in the Glossary at the end of this paper).
(1)The recovery of z(t) from experimental fluorescence time profiles and g(t) == f(t)*e(t) can be achieved by using several techniques of deconvolution as explained previously (1,2). This paper will deal with the recent phase plane technique.
THEORYSingle Exponcsntial Decay. Recently Greer, Reed, and Demas ( 3 , 4 ) have described a fast and accurate deconvolution technique: the "phase plane method". This technique allows the measurement of the lifetime, r, of emitting electronically excited states exhibiting the single exponential decaywhere A is a proportionality factor. We can write the convolution product asTaking the derivative of eq 4 leads toIntegration on both sides of this equation leads to (5) -Plotting u(t)/sg(t) vs. su(t)/sg(t) a t several values of the time t should lead to a straight line of slope -1 /~. The value of T is then determined by use of the least-squares fitting method.Biexponential Decay. Now we show here that the same method can also be used in the case of a biexponential decay (10)with zl(t) = Ale-t/TlPutting Ul(t) = g(t)*z,(t) u&) = g(t)*zz(t)the total fluorescence u ( t ) is given by u ( t ) = g(t)*z(t) = u1(t) + UJt)As previously (cf. ref 6), we can write By taking the derivative of these two equations and adding them, we get knowing that