1991
DOI: 10.1016/0040-6090(91)90507-t
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Kinetics and crystallization studies by in situ X-ray diffraction of the oxidation of chemically vapour deposited SiC

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Cited by 25 publications
(15 citation statements)
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“…In Figure , B results for Hi‐Nicalon™‐S (Table ) are compared to bulk SiC for both wet and dry oxidation . B C data for dry air oxidation that were explicitly stated to form crystalline scale are also shown .…”
Section: Resultsmentioning
confidence: 99%
“…In Figure , B results for Hi‐Nicalon™‐S (Table ) are compared to bulk SiC for both wet and dry oxidation . B C data for dry air oxidation that were explicitly stated to form crystalline scale are also shown .…”
Section: Resultsmentioning
confidence: 99%
“…Crystallization of SiO 2 scales to cristobalite or tridymite reduces oxygen permeability, and is a source of confusion in interpretation of SiC oxidation data that does not distinguish crystalline and amorphous scales . Crystallization of SiO 2 scales on nominally pure SiC is reported to start at temperatures of 1400°C, at temperatures as low as 700°C, and at temperatures in between . Disparity in these results illustrates the extreme sensitivity of silica crystallization to SiC impurities and trace H 2 O and other gases in the environment …”
Section: Introductionmentioning
confidence: 95%
“…During SiC oxidation SiO 2 crystallization starts between 700 and 1400°C . The wide range in temperature is due to the extreme sensitivity of silica crystallization to impurities, and to H 2 O and other gases in the oxidizing environment .…”
Section: Introductionmentioning
confidence: 99%