2020
DOI: 10.1080/03610918.2020.1757711
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Kernel method for overlapping coefficients estimation

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Cited by 7 publications
(4 citation statements)
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“…The computed features are then segregated into three categories depending on the APU State determined from the FADEC Data. For each of the features, coefficients of overlap (Δ and Δ ) [33] are then computed to evaluate performance, where:…”
Section: ) Evaluation Of Feature Response Against the Apu Statesmentioning
confidence: 99%
“…The computed features are then segregated into three categories depending on the APU State determined from the FADEC Data. For each of the features, coefficients of overlap (Δ and Δ ) [33] are then computed to evaluate performance, where:…”
Section: ) Evaluation Of Feature Response Against the Apu Statesmentioning
confidence: 99%
“…A performance metric was needed to compare the performance of each feature in terms of similarity between the results at the two sensor locations, and if applicable, its similarity with background noise features. For this purpose, the average values of the coefficients of overlap [32] were selected, and are defined as follows:…”
Section: Performance Metric For Feature Evaluationmentioning
confidence: 99%
“…Some authors defined to be the common area intersected by two or more probability density functions. There are another OVL measures that studied in the literature, such as Matusita measure (𝜌), Morsita measure (𝜆) and Weitzman measure (∆) (see and Eidous and Al-Talafha, 2020). There are another two overlap coefficients (OVL) known as, Pianka`s measure (PI) (see Chauby et al, 2008) and Kullback-Leibler`s (KL) (see Dhaker et al, 2019 and2021).…”
Section: Introductionmentioning
confidence: 99%
“…There are another OVL measures that studied in the literature, such as Matusita measure (𝜌), Morsita measure (𝜆) and Weitzman measure (∆) (see and Al-Talafha, 2020 andAl-Daradkeh, 2022 and the references therein). The overlap measures are commonly used is reliability analysis to estimate the proportion of machine or electronic devices that have similar range of failure time (Dhaker et al,2019) and genetics (Federer et al,.1963).…”
Section: Introductionmentioning
confidence: 99%