Kelvin probe force microscopy and electrostatic force microscopy responses to the polarization in a ferroelectric thin film: Theoretical and experimental investigations

Cuniot-Ponsard, Mireille

doi:10.1063/1.4812393

Cited by 14 publications

(7 citation statements)

References 36 publications

(49 reference statements)

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“…Bright and dark regions are highlighted in order to compare with the corresponding KPFM image of Figure b. As reported for KPFM measurements (performed positively biasing the AFM tip) on ferroelectric domains, , a higher (lower) surface potential corresponds to an upward (downward) polarization, a feature of BA (AB) stacking domains in t-hBN . Hence, bright (dark) phase domains (defined following the Asylum Research convention, see ref ) correspond to AB (BA) regions.…”

Section: Methodsmentioning

confidence: 89%

Moiré Modulation of Van Der Waals Potential in Twisted Hexagonal Boron Nitride

et al. 2022

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When a twist angle is applied between two layered materials (LMs), the registry of the layers and the associated change in their functional properties are spatially modulated, and a moiré superlattice arises. Several works explored the optical, electric, and electromechanical moiré-dependent properties of such twisted LMs but, to the best of our knowledge, no direct visualization and quantification of van der Waals (vdW) interlayer interactions has been presented, so far. Here, we use tapping mode atomic force microscopy phase-imaging to probe the spatial modulation of the vdW potential in twisted hexagonal boron nitride. We find a moiré superlattice in the phase channel only when noncontact (long-range) forces are probed, revealing the modulation of the vdW potential at the sample surface, following AB and BA stacking domains. The creation of scalable electrostatic domains, modulating the vdW potential at the interface with the environment by means of layer twisting, could be used for local adhesion engineering and surface functionalization by affecting the deposition of molecules or nanoparticles.

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Section: Methodsmentioning

confidence: 89%

Moiré Modulation of Van Der Waals Potential in Twisted Hexagonal Boron Nitride

et al. 2022

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“…The resultant surface charge screening is a general feature which affects the electrostatic and transport properties of surfaces, and thus, could probably lead to an incorrect interpretation of the data during the SPM measurements. 32,33 In general, electrostatic force microscope (EFM) is used to investigate the surface charge density (σs) of materials. The EFM image shown in Figure 2l was taken immediately after the electric poling, the bright contrast in the EFM pattern indicates the sign of the measuring image is not determined only by the polarization charges, but also uncompensated charges due to charge injection by electric poling.…”

Section: Domain Switching By Electric Fieldmentioning

confidence: 99%

Mechanical force involved multiple fields switching of both local ferroelectric and magnetic domain in a Bi5Ti3FeO15 thin film

et al. 2017

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Multiferroics have received intense attention due to their great application potential in multi-state information storage devices and new types of sensors. Coupling among ferroic orders such as ferroelectricity, (anti-)ferromagnetism, ferroelasticity and so on will enable dynamic interaction between these ordering parameters. Direct visualization of such coupling behavior in singlephase multiferroic materials is highly desirable for both applications and fundamental study. Manipulation of both ferroelectric and magnetic domains of Bi 5 Ti 3 FeO 15 thin film using electric field and external mechanical force is reported, which confirms the magnetoelectric coupling in Bi 5 Ti 3 FeO 15 , indicates the electric and magnetic orders are coupled through ferroelasticity. Due to the anisotropic relaxation of ferroelastic strain, the back-switching of out-of-plane electric domains is not as obvious as in-plane. An inevitable destabilization of the coupling between elastic and magnetic ordering happens because of the elastic strain relaxation, which result in a subsequent decay of magnetic domain switching. Mechanical force applied on the surface of Bi 5 Ti 3 FeO 15 film generates by an atomic force microscopy tip will effectively drive a transition of the local ferroelastic strain state, reverse both the polarization and magnetization in a way similar to an electric field. Current work provides a framework for exploring cross-coupling among multiple orders and potential for developing novel nanoscale functional devices.

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“…In the modeling of planar dielectrics, the samples are typically modeled as laterally infinite [22], in analogy with the case of metallic substrates [23,24]. In some studies, lateral finite-size effects have been considered by using simplified models that give physical insight into the problem, but do not allow accurate quantification of the experimental data [25,26]. Numerical calculations have also been used to understand some particular systems [27], but do not provide a general view of the finite-size issue.…”

Section: Introductionmentioning

confidence: 99%

Finite-size effects and analytical modeling of electrostatic force microscopy applied to dielectric films

2014

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A numerical analysis of the polarization force between a sharp conducting probe and a dielectric film of finite lateral dimensions on a metallic substrate is presented with the double objective of (i) determining the conditions under which the film can be approximated by a laterally infinite film and (ii) proposing an analytical model valid in this limit. We show that, for a given dielectric film, the critical diameter above which the film can be modeled as laterally infinite depends not only on the probe geometry, as expected, but mainly on the film thickness. In particular, for films with intermediate to large thicknesses (>100 nm), the critical diameter is nearly independent from the probe geometry and essentially depends on the film thickness and dielectric constant following a relatively simple phenomenological expression. For films that can be considered as laterally infinite, we propose a generalized analytical model valid in the thin-ultrathin limit (<20-50 nm) that reproduces the numerical calculations and the experimental data. Present results provide a general framework under which accurate quantification of electrostatic force microscopy measurements on dielectric films on metallic substrates can be achieved.

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Kelvin probe force microscopy and electrostatic force microscopy responses to the polarization in a ferroelectric thin film: Theoretical and experimental investigations

Cited by 14 publications

References 36 publications

Moiré Modulation of Van Der Waals Potential in Twisted Hexagonal Boron Nitride

Moiré Modulation of Van Der Waals Potential in Twisted Hexagonal Boron Nitride

Mechanical force involved multiple fields switching of both local ferroelectric and magnetic domain in a Bi5Ti3FeO15 thin film

Finite-size effects and analytical modeling of electrostatic force microscopy applied to dielectric films

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