2000
DOI: 10.1016/s0379-6779(99)00354-9
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Kelvin probe and ultraviolet photoemission measurements of indium tin oxide work function: a comparison

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Cited by 190 publications
(132 citation statements)
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“…This difference can in part be explained by the fact that UPS is known to measure the lowest work function, while the KP technique measures the average work function under the probe. 31,32 However, for UPS measurements the samples were also briefly exposed to the laboratory environment when loading into the UPS vacuum chamber, and so modification of the surface potential contribution to work function by surface contamination is likely. Conversely the KP measurements were made using a KP located in the same nitrogen filled glovebox as used for film deposition, and so measurements made using the KP technique are considered to be more reliable in this instance, a conclusion corroborated by the device studies described in a subsequent part of this paper.…”
Section: Research Articlementioning
confidence: 99%
“…This difference can in part be explained by the fact that UPS is known to measure the lowest work function, while the KP technique measures the average work function under the probe. 31,32 However, for UPS measurements the samples were also briefly exposed to the laboratory environment when loading into the UPS vacuum chamber, and so modification of the surface potential contribution to work function by surface contamination is likely. Conversely the KP measurements were made using a KP located in the same nitrogen filled glovebox as used for film deposition, and so measurements made using the KP technique are considered to be more reliable in this instance, a conclusion corroborated by the device studies described in a subsequent part of this paper.…”
Section: Research Articlementioning
confidence: 99%
“…It has also been pointed out [19] that the discrepancy between KP and UPS values is well-documented [23][24][25][26]. Variation in the reference values will directly contribute to the differences observed by UPS and KP.…”
Section: -P5 Epj Photovoltaicsmentioning
confidence: 98%
“…Variation in the reference values will directly contribute to the differences observed by UPS and KP. Further fundamental differences exist [24] in the work function measuring principles of KP and UPS. UPS measures that of the lowest energy electrons that escape the film surface upon excitation with the UV source and invariably gives only lowest work function in the measured area.…”
Section: -P5 Epj Photovoltaicsmentioning
confidence: 99%
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