Kapitza thermal resistance studied by high-frequency photothermal radiometry

Abstract

Kapitza thermal resistance is determined using high-frequency photothermal radiometry (PTR) extended for modulation up to 10 MHz. Interfaces between 50 nm thick titanium coatings and silicon or stainless steel substrates are studied. In the used configuration, the PTR signal is not sensitive to the thermal conductivity of the film nor to its optical absorption coefficient, thus the Kapitza resistance is directly determined from single thermal parameter fits. Results of thermal resistances show the significant influence of the nature of the substrate, as well as of the presence of free electrons at the interface.

Size effects of graphene nanoplatelets on the properties of high-density polyethylene nanocomposites: morphological, thermal, electrical, and mechanical characterization

“…Afterwards, a lock-in amplifier (Stanford Research Systems SR865) output the amplitude and phase of the detector's electrical signal proportional to the variation of the sample surface temperature, which depended on its thermophysical properties. A more detailed description of the setup used can be found elsewhere [42]. Using this PTR setup, different types of material (nanocomposites [3], organic [43][44][45], irradiated [46], metal-semiconductor couples [42,47], etc.)…”

“…A more detailed description of the setup used can be found elsewhere [42]. Using this PTR setup, different types of material (nanocomposites [3], organic [43][44][45], irradiated [46], metal-semiconductor couples [42,47], etc.) can be thermally characterized to determine thermophysical properties, such as the thermal diffusivity and thermal effusivity.…”

Estimation of Thermal Resistance Field in Layered Materials by Analytical Asymptotic Method

“…If only the first p singular values are different from zero (p < n), the SVD can then be further reduced. Thus, the pseudoinversion of Equation (4) gives:…”

“…One of the most common procedures is based on the 3ω technique [1], which has been extensively used since it offers absolute measurements of the heat flux and the temperature and is also well suited for characterizations at low temperatures. At high temperatures, contactless photothermal methods, such as the thermoreflectance [2,3] and infrared radiometry [4][5][6] techniques, have been implemented and allow measuring the relative change in temperature and heat flux. Nevertheless, calibration is a complex task within those experimental configurations.…”

The periodic pulse photothermal radiometry technique within the front face configuration

“…Contact methods, as the 3ω technique [1,2], have been extensively used since they offered absolute measurements of the heat flux and the temperature and they are also well suited with characterization at low temperature. At high temperature, the contactless photothermal methods, as the visible (VIS) thermoreflectance [3,4,5,6,7,8] and the infrared (IR) radiometry techniques [9,10,11,12,13,14], have been implemented and allow measuring relative change of the temperature and the heat flux. Within those experimental configurations, the calibration can be a complex task and it is highly advised to work with relative measurements, for both the heat flux and the temperature, instead of absolute ones.…”