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Kokin, S. M.; Mikov, S. N.; Puzov, I. P.

doi:10.1023/a:1014342913752

Cited by 2 publications

(1 citation statement)

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“…One can see that indeed EL spectra at 400 Hz drive is much "greener" comparing to CL and PL, such results are used to argue that EL is a bulk process taking place in the depth of phosphor grain [3]. But if we compare PL and CL spectra with EL one acquired at 2500 Hz drive we can see that the letter is very close to the former ones.…”

Section: Table 1 Change Of El Properties By Plasma-treatmentmentioning

confidence: 64%

P-94: Plasma Modification of ZnS:Cu EL Phosphor

Sychov

Erusin

Komarov

et al. 2006

SID Symposium Digest

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We report nitrogen plasma modification of the ZnS: Cu, Br electroluminescence phosphor. Modification resulted in 30% improvement of ZnS: Cu, Al EL brightness at 220V drive. In the same time emission peak shifted of from 486 to 504nm due to increase of relative intensity of green band in EL spectrum. Thus plasma treatment is a perspective method for the control of EL brightness and spectra of ZnS phosphors.

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Section: Table 1 Change Of El Properties By Plasma-treatmentmentioning

confidence: 64%

P-94: Plasma Modification of ZnS:Cu EL Phosphor

Sychov

Erusin

Komarov

et al. 2006

SID Symposium Digest

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Dynamical analysis of relaxation luminescence in ZnS:Er3+ thin film devices

Wang

Mou-zhi

et al. 2003

Journal of Applied Physics

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The relaxation luminescence of ZnS:Er3+ thin film devices fabricated by thermal evaporation with two boats is studied. The dynamical processes of the luminescence of Er3+ in ZnS are described in terms of a resonant energy transfer model, assuming that the probability of collision excitation of injected electrons with luminescence centers is expressed as a Gaussian function. It is found that the frequency distribution depends on the Lorentzian function by considering the emission from excited states as a damped oscillator. Taking into consideration the energy storing effect of traps, an expression is obtained to describe a profile that contains multiple relaxation luminescence peaks using the convolution theorem. Fitting of experimental results shows that the relaxation characteristics of the electroluminescence are related to the carriers captured by bulk traps as well as by interface states. The numerical calculation carried out agrees well with the dynamical characteristics of relaxation luminescence obtained by experiments.

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Cited by 2 publications

References 2 publications

P-94: Plasma Modification of ZnS:Cu EL Phosphor

P-94: Plasma Modification of ZnS:Cu EL Phosphor

Dynamical analysis of relaxation luminescence in ZnS:Er3+ thin film devices

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