2015
DOI: 10.1016/j.apsusc.2015.08.135
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ITO induced tunability of surface plasmon resonance of silver thin film

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Cited by 13 publications
(5 citation statements)
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“…In the electronic structure of the ITO film, the Sn atom that replaces an In atom results in a single free electron. Therefore, the ITO(170 nm)/ In-Sn films are expected to have the lowest free electron density of the studied ITO NPs, resulting in the lower LSPR frequency [46], as shown in figure 5. On the other hand, it is known that plasmonic coupling takes place when the layers are close to each other, and therefore, the plasmon resonance of each layer is affected by the plasmon resonance of its neighboring layer.…”
Section: Resultsmentioning
confidence: 96%
“…In the electronic structure of the ITO film, the Sn atom that replaces an In atom results in a single free electron. Therefore, the ITO(170 nm)/ In-Sn films are expected to have the lowest free electron density of the studied ITO NPs, resulting in the lower LSPR frequency [46], as shown in figure 5. On the other hand, it is known that plasmonic coupling takes place when the layers are close to each other, and therefore, the plasmon resonance of each layer is affected by the plasmon resonance of its neighboring layer.…”
Section: Resultsmentioning
confidence: 96%
“…The gold grains have a preferential orientation along the (111) crystal direction. In general, for non-epitaxial deposition, the film structure tends to be along the (111) or (001) planes due to the minimum surface free energy [ 19 , 20 ]. No prominent peaks corresponding to the single silver film were observed, probably due to the amorphous nature of thin film due to the magnetron sputtering method.…”
Section: Resultsmentioning
confidence: 99%
“…[32,33] Currently, the most popular TCO material is ITO because it can be heavily doped. [28,34] Ma et al adjusted the surface plasmon resonance (SPR) frequency in the NIR region by controlling the dopant concentration and the size and shape of ITO NPs. [35] Hong et al studied the effect of ITO as a dielectric material by comparing the SPR wavelength and absorption intensity of the ITO/Ag and Ag layers in the visible region.…”
Section: Introductionmentioning
confidence: 99%