Iterative control approach to high-speed force-distance curve measurement using AFM: Time-dependent response of PDMS example

Kim, Kyong-Soo; Lin, Zhiqun; Shrotriya, Pranav; Sundararajan, Sriram; Zou, Qingze

doi:10.1016/j.ultramic.2008.03.001

Cited by 43 publications

(48 citation statements)

References 34 publications

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“…Such a trend clearly demonstrated the rate-dependent mechanical response of PDMS: as the excitation frequency was increased, PDMS became stiffer, which can be due to viscoelastic nature of the polymer; hence, a faster external deformation rate transitioned the response of PDMS from rubbery toward being glassy. 9 These experiment results demonstrate the efficacy of the proposed technique.…”

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confidence: 56%

“…6 The efficacy of the iterative control approaches to eliminate the hardware dynamics effects on SPM force measurement has been demonstrated in the authors' recent work. 9 This article extends such efforts by improving both the iterative control algorithm ͑the SPM dynamics model is needed by the control algorithm in Ref. 9͒ and more importantly, the excitation force profile ͑the band-limited white noise rather than the quasistatic triangle signal 9 ͒.…”

mentioning

confidence: 95%

“…First, the MIIC algorithm was applied to enable the cantilever deflection on a PDMS sample to track a band-limited white-noise desired trajectory ͑see Ref. 9 for the preparation of the PDMS sample͒. This tracking implied that the adverse effects of the z-axis SPM dynamics were eliminated to allow the desired excitation force profile to be exerted onto the PDMS sample.…”

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confidence: 99%

“…Magnitudes of instantaneous and fully relaxed modulus compare well with DMA tests on the same samples. 9 At room temperature, PDMS is above its glass temperature and displays a clear viscoelastic solid response. Our proposed characterization technique clearly captures the rate dependent viscoelastic nature of the PDMS polymer.…”

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confidence: 99%

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Broadband measurement of rate-dependent viscoelasticity at nanoscale using scanning probe microscope: Poly(dimethylsiloxane) example

Kim

Zou

et al. 2008

Applied Physics Letters

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A control approach to achieve nanoscale broadband viscoelastic measurement using scanning probe microscope (SPM) is reported. Current SPM-based force measurement is too slow to measure rate-dependent phenomena, and large (temporal) measurement errors can be generated when the sample itself changes rapidly. The recently developed model-less inversion-based iterative control technique is used to eliminate the dynamics and hysteresis effects of the SPM hardware on the measurements, enabling rapid excitation and measurement of rate-dependent material properties. The approach is illustrated by the mechanical characterization of poly(dimethylsiloxane) over a broad frequency range of three orders of magnitude (∼1 Hz to 4.5 KHz).

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confidence: 56%

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confidence: 95%

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confidence: 99%

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confidence: 99%

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Broadband measurement of rate-dependent viscoelasticity at nanoscale using scanning probe microscope: Poly(dimethylsiloxane) example

Kim

Zou

et al. 2008

Applied Physics Letters

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“…SPM is not only a unique tool to obtain nanoscale image of materials, but also becomes a powerful tool to characterize various nano-scale materials properties through the measurement of tip-sample interaction force, i.e., the force curve measurement [6]. To obtain the force curve, a microfabricated cantilever with a nano-size tip (see Fig.…”

Section: A Nanoscale Materials Property Measurement Using Spmmentioning

confidence: 99%

Control-based approach to broadband viscoelastic spectroscopy: PDMS example

Zou

Shrotriya

et al. 2009

2009 American Control Conference

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In this article, a novel nanoscale broadband viscoelastic spectroscopy approach is proposed. The proposed approach utilizes the recently developed model-less inversionbased iterative control (MIIC) technique for accurate measurement of the material response to the applied excitation force over a broad frequency band. Current nanomechanical measurement is slow and narrow-banded and thus not capable of measuring rate-dependent phenomena of materials. In the proposed approach, an input force signal with dynamic characteristics of band-limited white-noise is utilized to rapidly excite the nanomechanical response of the material over a broad frequency range. Then, the MIIC technique is used to compensate for the hardware adverse effects, thereby allowing the precise applications of such an excitation force and measurement of the material response (to the applied force). The proposed approach is illustrated by implementing it to measure the creep compliance of poly(dimethylsiloxane) (PDMS) over a broad frequency range over 3 orders of magnitude. I. INTRODUCTIONIn this article, a novel nanoscale broadband viscoelastic spectroscopy (NBVS) methodology is proposed. The proposed NBVS approach utilizes the recently developed modelless inversion-based iterative control (MIIC) technique [1] to allow rapid excitation and subsequent measurement of the nanomechanical behavior of materials over a broad frequency band. The scanning probe microscope (SPM) has become an enabling tool to quantitatively measure the mechanical properties of a wide variety of materials [2]. Current SPMbased force measurements, however, are limited by the slow operation of SPM to measure the rate-dependent phenomena of materials [3], and large measurement (temporal) errors can be generated when dynamic evolution of the material is involved during the measurement. Operating speed of current SPMs is limited by: (1) the excitation force applied, which is either quasi-static or resonant-oscillation based, is either too narrow-banded in frequency (quasi-static) or too slow (resonant oscillation based) to rapidly excite the nanomechanical behavior of materials over a broad frequency band; and (2) the hardware adverse effects can be coupled into the measured data if the measurement is at high-speed and over a broad frequency range. These adverse effects include the hysteresis of the piezo actuator (used to position the probe relative to the sample), the vibrational dynamics of the piezo actuator and the probe along with the mechanical parts, and the dynamics uncertainties.

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Toward a better modulus at shallow indentations—Enhanced tip and sample characterization for quantitative atomic force microscopy

Owen

2022

Microscopy Res & Technique

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Approximations of the geometry of indenting probes, particularly when using shallow indentations on soft materials, can lead to the erroneous reporting of mechanical data in atomic force microscopy (AFM). Scanning electron microscopy (SEM) identified a marked change in geometry toward the tip apex where the conical probe assumes a near linear flat-punch geometry. Polydimethylsiloxane (PDMS) is a ubiquitous elastomer within the materials and biological sciences. Its elastic modulus is widely characterized but the data are dispersed and can display orders of magnitude disparity. Herein, we compare the moduli gathered from a range of analytical techniques and relate these to the molecular architecture identified with AFM. We present a simple method that considers sub-100 nm indentations of PDMS using the Hertz and Sneddon contact mechanics models, and how this could be used to improve the output of shallow indentations on similarly soft materials, such as polymers or cells.

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Iterative control approach to high-speed force-distance curve measurement using AFM: Time-dependent response of PDMS example

Cited by 43 publications

References 34 publications

Broadband measurement of rate-dependent viscoelasticity at nanoscale using scanning probe microscope: Poly(dimethylsiloxane) example

Broadband measurement of rate-dependent viscoelasticity at nanoscale using scanning probe microscope: Poly(dimethylsiloxane) example

Control-based approach to broadband viscoelastic spectroscopy: PDMS example

Toward a better modulus at shallow indentations—Enhanced tip and sample characterization for quantitative atomic force microscopy

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