2019
DOI: 10.1116/1.5116021
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Isotropic silicon etch characteristics in a purely inductively coupled SF6 plasma

Abstract: Publisher's PDF, also known as Version of record Cyswllt i'r cyhoeddiad / Link to publication Dyfyniad o'r fersiwn a gyhoeddwyd / Citation for published version (APA):

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Cited by 17 publications
(12 citation statements)
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“…hBN was first exfoliated on a clean SiO 2 substrate and then transferred on top of the bottom electrode (Figure a,e) with a stamp made from a polydimethylsiloxane (PDMS) block and a polycarbonate (PC) film. , After top contact patterning (Figure b,f), the sandwiched hBN layer was isotropically removed via reactive ion etching (RIE) to form an underetched region of width d c between the top and bottom electrode (Figure c,g). Using SF 6 as the process gas increases the etch isotropy and hence lateral etching rate in the normally vertical directed RIE due to a high density of SF 5 * and F* radicals, which in turn are responsible for bulk etching. The process steps, including spin-coating of the donor–acceptor polymer poly­(diketopyrrolopyrrole-terthiophene) (PDPP), removal of PDPP via directional RIE, and deposition of the ionic liquid 1-ethyl-3-methylimidazolium bis­(trifluoromethylsulfonyl)­imide ([EMIM]­[TFSI]) as the gate electrode, complete the devices . Using ionic liquids as gate care should be taken to not exceed the electrochemical window which is defined by the difference between the oxidation and reduction potential of cations and anions.…”
Section: Resultsmentioning
confidence: 99%
“…hBN was first exfoliated on a clean SiO 2 substrate and then transferred on top of the bottom electrode (Figure a,e) with a stamp made from a polydimethylsiloxane (PDMS) block and a polycarbonate (PC) film. , After top contact patterning (Figure b,f), the sandwiched hBN layer was isotropically removed via reactive ion etching (RIE) to form an underetched region of width d c between the top and bottom electrode (Figure c,g). Using SF 6 as the process gas increases the etch isotropy and hence lateral etching rate in the normally vertical directed RIE due to a high density of SF 5 * and F* radicals, which in turn are responsible for bulk etching. The process steps, including spin-coating of the donor–acceptor polymer poly­(diketopyrrolopyrrole-terthiophene) (PDPP), removal of PDPP via directional RIE, and deposition of the ionic liquid 1-ethyl-3-methylimidazolium bis­(trifluoromethylsulfonyl)­imide ([EMIM]­[TFSI]) as the gate electrode, complete the devices . Using ionic liquids as gate care should be taken to not exceed the electrochemical window which is defined by the difference between the oxidation and reduction potential of cations and anions.…”
Section: Resultsmentioning
confidence: 99%
“…The shapes of the pre-tips made by isotropic ICP etching, such as the height and aspect ratio, are influenced by the mask design, which affects the gas supply and venting of reaction products of the pre-tip. Moreover, the profiles of the tips made with the conventional aperture mask and the “island mask” show clear differences [ 43 ]. The mask pattern shown in Figure 2 a was designed to investigate the effect of gas supply from different directions during the etching process.…”
Section: Resultsmentioning
confidence: 99%
“…The roughness associated with this etch is expected, due to its chemical nature, and can be undesirable in an optical context, for example leading to scattering. A detailed study of this etching process has been presented in [12].…”
Section: Sf 6 Etch Characteristicsmentioning
confidence: 99%