Isotope dilution mass spectrometry for quantitative elemental analysis of powdered samples by radiofrequency pulsed glow discharge time of flight mass spectrometry

Forty‐Nine Major and Trace Element Concentrations Measured in Soil Reference Materials NIST SRM 2586, 2587, 2709a, 2710a and 2711a Using ICP‐MS and Wavelength Dispersive‐XRF

“…Along with NIST SRM 2586 and 2587, these five reference materials present a continuum of heavy metal concentrations and are considered representative of soils likely to be encountered in urban agriculture/urban geochemistry studies. However, characterisation of these five soil RMs remains incomplete because very few reference values are available in the literature (Moon et al 2009, Paul et al 2009, Hoang et al 2010, Goix et al 2011, Milliard et al 2011, Alvarez-Toral et al 2013, Eriksson et al 2013, Fern andez et al 2014. The purpose of this study is to further characterise the variability in element concentrations (strictly, the mass fractions) in the five NIST SRM soil materials and provide reference values for previously uncharacterised elements.…”

Depth Profile Analysis of Amorphous Silicon Thin Film Solar Cells by Pulsed Radiofrequency Glow Discharge Time of Flight Mass Spectrometry

“…Spectral interferences removal is crucial for the quantification of some important analytes, such as . In the last years, rf-PGD-TOFMS has been successfully tested and applied for the analysis of rather varied materials, such as polymers [10], ultra-low energy implants [11], fluorine-containing tantala layers [12], or even isotopically enriched pellets [13]. Concerning GD applications to photovoltaic materials, GD-OES and GD-MS have been employed, for example, for the analysis of aluminium doped ZnO films [14], boron implanted and solar grade silicon [15,16].…”