Rev. Phys. Appl. (Paris)
 1980
DOI: 10.1051/rphysap:01980001502030700
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Irradiation de l'antimoine dans un microscope électronique à haute tension et observation de boucles de défauts ponctuels

B. Legros de Mauduit
1
,
G. Alcouffe
2
,
F. Reynaud
3
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Cited by 3 publications
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