2008
DOI: 10.1016/j.solmat.2007.03.029
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Iridium-based oxides: Recent advances in coloration mechanism, structural and morphological characterization

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Cited by 24 publications
(17 citation statements)
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“…The CV was performed between −0.3 and +1 V versus the Ag/ AgCl reference electrode at 20 mV/ s using an Ecochemie Autolab/GPES interface. One of our previous studies 33 indicated a 10% increase of oxygen content in the films during these initial cycles.…”
Section: Methodsmentioning
confidence: 67%
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“…The CV was performed between −0.3 and +1 V versus the Ag/ AgCl reference electrode at 20 mV/ s using an Ecochemie Autolab/GPES interface. One of our previous studies 33 indicated a 10% increase of oxygen content in the films during these initial cycles.…”
Section: Methodsmentioning
confidence: 67%
“…Additional structural characterization by atomic force microscopy, x-ray diffraction, transmission electron microscopy ͑TEM͒, Rutherford backscattering spectroscopy, and x-ray photoelectron spectroscopy of both types of films were presented in two recent papers. 32,33 The compositions of the as-deposited films were IrO 2.2 and IrTa 1.4 O 5.6 , respectively, with a surface roughness of about 9 nm and a grain size of 3 -4 nm for both types of films. Preliminary observations of cross section TEM images show that IrTaOx has a diffuse columnar structure, whereas the IrOx has a more porous structure, which is sensitive to electron beam irradiation.…”
Section: Methodsmentioning
confidence: 99%
“…A multi target sputter system, based on a Balzers UTT400 unit, nm to 110 nm, using an Alpha Step profilometer. Additional structural characterization of the films was presented in recent papers [12,13]. The compositions of the as-deposited films were WO 3+/-0.1, IrO 2.2 and IrTa 1.4 O 5.6 , as obtained from Rutherford Backscattering Spectrometry and X-ray Photoelectron Spectroscopy.…”
Section: Methodsmentioning
confidence: 99%
“…For most EC devices-including -smart‖ windows-it is desirable to have a large CE. well as transmission electron microscopy in earlier work [15,29].…”
Section: Electrochemical and Optical Measurementsmentioning
confidence: 82%
“…Ir oxide has been studied in this context at least since 1978 [10,11], and sputter deposited EC films were reported in 1979 [12]; the early literature has been reviewed in detail [1]. The research field maintains its vitality [13][14][15][16][17][18][19][20]. Concerning durability, we notice that Ir oxide films have undergone EC cycling for up to 7 × 10 6 ion insertion/extraction cycles without significant degradation [21].…”
Section: There Are Two Types Of Ec Thin Films: One Is Called -Cathodimentioning
confidence: 95%