2017
DOI: 10.1117/12.2258340
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IR-drop analysis for validating power grids and standard cell architectures in sub-10nm node designs

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Cited by 2 publications
(4 citation statements)
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“…We showed that the FCA current allows to minimize IR-drop in the metal lines of a high performance processor die. Therefore, it prevents performance degradation due to slow transition or failure of gates in highly power-consuming areas [7]. Furthermore, FCAs allow to relax power grid density requirements in areas with lower power consumption.…”
Section: Background On Fca Technologymentioning
confidence: 99%
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“…We showed that the FCA current allows to minimize IR-drop in the metal lines of a high performance processor die. Therefore, it prevents performance degradation due to slow transition or failure of gates in highly power-consuming areas [7]. Furthermore, FCAs allow to relax power grid density requirements in areas with lower power consumption.…”
Section: Background On Fca Technologymentioning
confidence: 99%
“…• FCA power ensures maintaining the IR-drop across 3D MP-SoC dies under 5%, which is a typical IR-drop constraint for high performance chip design [7], and is equivalent to under 27𝑚𝑉 for the 3𝑛𝑚 technology. High FCA IR-drop reduction is due to two main factors.…”
Section: Fca Ir-drop Reduction Capabilitiesmentioning
confidence: 99%
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“…Consequently, this has led to increased route congestion, which poses a hindrance to effectively reducing chip size. Furthermore, as the IR-drop in the power delivery network (PDN) becomes more severe, the demand for metal in a limited metal track resource has increased, leading to an increasingly critical shortage of route resources [3][4].…”
Section: Introductionmentioning
confidence: 99%