IPFA 2017 NOR flash new EA extracted method-using the variation of FG electrons concentration

Chia-Sheng, Huang; Lin, Shih Chia

doi:10.1109/ipfa.2017.8060070

2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2017

DOI: 10.1109/ipfa.2017.8060070

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IPFA 2017 NOR flash new EA extracted method-using the variation of FG electrons concentration

Huang Chia-Sheng

Shih Chia Lin

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IPFA 2017 NOR flash new EA extracted method-using the variation of FG electrons concentration

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