Ionizing radiation defects and reliability of Gallium Nitride-based III-V semiconductor devices: A comprehensive review

Sandeep, V.; Pravin, J. Charles; Kumar, S. Ashok

doi:10.1016/j.microrel.2024.115445

Microelectronics Reliability

2024

DOI: 10.1016/j.microrel.2024.115445

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Ionizing radiation defects and reliability of Gallium Nitride-based III-V semiconductor devices: A comprehensive review

V. Sandeep,

J. Charles Pravin,

S. Ashok Kumar

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Ionizing radiation defects and reliability of Gallium Nitride-based III-V semiconductor devices: A comprehensive review

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References 191 publications

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