Abstract:A novel, low-cost, pixel-based detector array (described elsewhere Sinha and Wadsworth (76 (2), 1) is examined using different charged particles, from electrons to hyperthermal (G100 eV) large biomolecular positive and negative ions, including keV small atomic and molecular ions. With this in mind, it is used in instrumentation design (beam profiling), mass spectrometry, and electron spectroscopy. The array detector is a modified light-sensitive charge-coupled device (CCD) that was engineered for direct charge… Show more
“…At relatively low electron energies (G250 eV); electrons have virtually no chemical or physical effect on the electrodes due to the very low momentum involved. As demonstrated in the previous work [2], detection of low energy and high molecular ion mass shows no effect on the inert TiN surface either. In the low eV/u regime (G0.1 eV/u), soft-landing of the species is the underlying process and no damage is inflicted on the surface, as well.…”
Section: Surface Characterizationsupporting
confidence: 63%
“…This structure can be reproduced in the simulation, using velocity reversal analysis in the IonCCD region under the assumption that image charges induced by the deflected ion in the IonCCD material are causing the effect. This discovery is very interesting, since it broadens the range of applications for the IonCCD from incoming negative ions and electrons (as demonstrated previously [2]) to ion glancing induced image charge formation in the detector surface. A detailed experimental and simulative study of this effect is beyond the scope of this article and will be subject to a subsequent work.…”
Section: Methodsmentioning
confidence: 59%
“…The IonCCD used as a focal plane array detector was described recently, elsewhere [2]. Briefly it consists of a 2126× 1 pixel array spanning 51-mm with 21×1500 μm 2 pixel area.…”
Section: Methodsmentioning
confidence: 99%
“…For the experiments reported here and a in a previous study [2], we exposed the TiN surface of the IonCCD electrodes to several types of projectiles, ranging from 250 eV electrons over hyperthermal biomolecules (G20 eV, 91100 u, obtained from an ESI source) up to keV ions (2 keV, 4-40 u, obtained from an EI source). At relatively low electron energies (G250 eV); electrons have virtually no chemical or physical effect on the electrodes due to the very low momentum involved.…”
Section: Surface Characterizationmentioning
confidence: 99%
“…In the field of non-scanning sector-field mass spectrometry focal plane camera with CMOS technology [32] and IonCCD [1,2] were successfully used. Those latter detectors are, rather, charge collectors with no temporal resolution capability as they do not provide single-particle detection capability.…”
A recently described ion charge coupled device detector IonCCD (Sinha and Wadsworth, Rev. Sci. Instrum. 76(2), 2005; Hadjar, J. Am. Soc. Mass Spectrom. 22(4), [612][613][614][615][616][617][618][619][620][621][622][623][624] 2011) is implemented in a miniature mass spectrometer of sector-field instrument type and MattauchHerzog (MH)-geometry (Rev. Sci. Instrum. 62(11), 2618-2620, 1991; Burgoyne, Hieftje and Hites J. Am. Soc. Mass Spectrom. 8(4), 307-318, 1997; Nishiguchi, Eur. J. Mass Spectrom. 14 (1), 7-15, 2008) for simultaneous ion detection. In this article, we present first experimental evidence for the signature of energy loss the detected ion experiences in the detector material. The two energy loss processes involved at keV ion kinetic energies are electronic and nuclear stopping. Nuclear stopping is related to surface modification and thus damage of the IonCCD detector material. By application of the surface characterization techniques atomic force microscopy (AFM) and X-ray photoelectrons spectroscopy (XPS), we could show that the detector performance remains unaffected by ion impact for the parameter range observed in this study. Secondary electron emission from the (detector) surface is a feature typically related to electronic stopping. We show experimentally that the properties of the MH-mass spectrometer used in the experiments, in combination with the IonCCD, are ideally suited for observation of these stopping related secondary electrons, which manifest in reproducible artifacts in the mass spectra. The magnitude of the artifacts is found to increase linearly as a function of detected ion velocity. The experimental findings are in agreement with detailed modeling of the ion trajectories in the mass spectrometer. By comparison of experiment and simulation, we show that a detector bias retarding the ions or an increase of the B-field of the IonCCD can efficiently suppress the artifact, which is necessary for quantitative mass spectrometry.
“…At relatively low electron energies (G250 eV); electrons have virtually no chemical or physical effect on the electrodes due to the very low momentum involved. As demonstrated in the previous work [2], detection of low energy and high molecular ion mass shows no effect on the inert TiN surface either. In the low eV/u regime (G0.1 eV/u), soft-landing of the species is the underlying process and no damage is inflicted on the surface, as well.…”
Section: Surface Characterizationsupporting
confidence: 63%
“…This structure can be reproduced in the simulation, using velocity reversal analysis in the IonCCD region under the assumption that image charges induced by the deflected ion in the IonCCD material are causing the effect. This discovery is very interesting, since it broadens the range of applications for the IonCCD from incoming negative ions and electrons (as demonstrated previously [2]) to ion glancing induced image charge formation in the detector surface. A detailed experimental and simulative study of this effect is beyond the scope of this article and will be subject to a subsequent work.…”
Section: Methodsmentioning
confidence: 59%
“…The IonCCD used as a focal plane array detector was described recently, elsewhere [2]. Briefly it consists of a 2126× 1 pixel array spanning 51-mm with 21×1500 μm 2 pixel area.…”
Section: Methodsmentioning
confidence: 99%
“…For the experiments reported here and a in a previous study [2], we exposed the TiN surface of the IonCCD electrodes to several types of projectiles, ranging from 250 eV electrons over hyperthermal biomolecules (G20 eV, 91100 u, obtained from an ESI source) up to keV ions (2 keV, 4-40 u, obtained from an EI source). At relatively low electron energies (G250 eV); electrons have virtually no chemical or physical effect on the electrodes due to the very low momentum involved.…”
Section: Surface Characterizationmentioning
confidence: 99%
“…In the field of non-scanning sector-field mass spectrometry focal plane camera with CMOS technology [32] and IonCCD [1,2] were successfully used. Those latter detectors are, rather, charge collectors with no temporal resolution capability as they do not provide single-particle detection capability.…”
A recently described ion charge coupled device detector IonCCD (Sinha and Wadsworth, Rev. Sci. Instrum. 76(2), 2005; Hadjar, J. Am. Soc. Mass Spectrom. 22(4), [612][613][614][615][616][617][618][619][620][621][622][623][624] 2011) is implemented in a miniature mass spectrometer of sector-field instrument type and MattauchHerzog (MH)-geometry (Rev. Sci. Instrum. 62(11), 2618-2620, 1991; Burgoyne, Hieftje and Hites J. Am. Soc. Mass Spectrom. 8(4), 307-318, 1997; Nishiguchi, Eur. J. Mass Spectrom. 14 (1), 7-15, 2008) for simultaneous ion detection. In this article, we present first experimental evidence for the signature of energy loss the detected ion experiences in the detector material. The two energy loss processes involved at keV ion kinetic energies are electronic and nuclear stopping. Nuclear stopping is related to surface modification and thus damage of the IonCCD detector material. By application of the surface characterization techniques atomic force microscopy (AFM) and X-ray photoelectrons spectroscopy (XPS), we could show that the detector performance remains unaffected by ion impact for the parameter range observed in this study. Secondary electron emission from the (detector) surface is a feature typically related to electronic stopping. We show experimentally that the properties of the MH-mass spectrometer used in the experiments, in combination with the IonCCD, are ideally suited for observation of these stopping related secondary electrons, which manifest in reproducible artifacts in the mass spectra. The magnitude of the artifacts is found to increase linearly as a function of detected ion velocity. The experimental findings are in agreement with detailed modeling of the ion trajectories in the mass spectrometer. By comparison of experiment and simulation, we show that a detector bias retarding the ions or an increase of the B-field of the IonCCD can efficiently suppress the artifact, which is necessary for quantitative mass spectrometry.
Electrolytic spray deposition was used to pattern surfaces with 2D metallic nanostructures. Spots that contain silver nanoparticles (AgNP) were created by landing solvated silver ions at desired locations using electrically floated masks to focus the metal ions to an area as little as 20 mm in diameter. The AgNPs formed are unprotected and their aggregates can be used for surface-enhanced Raman spectroscopy (SERS). The morphology and SERS activity of the NP structures were controlled by the surface coverage of landed silver ions. The NP structures created could be used as substrates onto which SERS samples were deposited or prepared directly on top of predeposited samples of interest. The evenly distributed hot spots in the micron-sized aggregates had an average SERS enhancement factor of 10 8 . The surfaces showed SERS activity when using lasers of different wavelengths (532, 633, and 785 nm) and were stable in air.Metallic nanoparticles have attractive properties in catalysis, photonics, and chemical sensing. [1] Raman spectroscopy is a powerful nondestructive technique, [2] the sensitivity of which can be significantly improved through surfaceenhanced or tip-enhanced methods. [3] The enhancement arises from the proximity of the analytes to intense localized fields created by nanoscale objects. [4] The capability to modify, coat, and pattern surfaces with nanostructures is important for SERS and also for a wider range of nanomaterials applications. [5] Conventionally, modified surfaces are constructed by delivering intact nanoparticles to target locations through dropcasting or spin coating. [6] However, the difficulty in positioning discrete particles with control over orientation, position, and degree of aggregation means that drop casting of nanoparticles has not been widely used in the highthroughput preparation of SERS substrates. Immobilized and shell-isolated nanosystems [5b, 6c, 7] address these issues, but the necessary vacuum preparation procedures significantly increase the complexity of such approaches.Ion/surface collisions including ion soft-landing have been used to fabricate surface structures under vacuum. [8] Recently an electrolytic spray ionization method [9] has been developed that is capable of generating noble metal ions directly from their solids under ambient conditions as precursors for nanoparticle synthesis. Herein, we report the in situ fabrication of SERS-active spots and micro-scale patterns by landing ionized silver at desired locations where spontaneous cathodic reduction takes place, allowing the creation of nanostructure assemblies.Silver is a widely used SERS material [10] and the plasmon resonance of silver nanostructures is tunable through the visible to mid-infrared regions of the electromagnetic spectrum. [11] Electrolytic spray deposition readily creates spots of approximately 3 mm in diameter composed of silver particles (AgNP) at desired locations, both on top of previously deposited analyte as well as prior to analyte deposition (Figure 1). Both the NP-on-top and ...
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