Exposure characteristics and mesh mask pattern replication of two negative resists, AZ1350J and IPS (iodinated polystyrene), by hydrogen ion beam are reported. A 180 keV hydrogen ion beam exposure followed by a flood u.v. light exposure makes it possible to use AZ1350J as a negative ion beam resist (IDER: ion desensitization of photosensitive resist). The sensitivity and contrast factor of IDER are
3×10−6C/cm2
and 2.0, respectively, while
3×10−7C/cm2
and 3.0 for IPS, respectively. The mesh mask patterns are neatly replicated on these resists, and suggest the potential high resolution of these resists. Reactive ion etching of an
SiO2
layer through the patterns are performed. Both resists show good resistance against reactive ion etching, which is an indispensable tool for the coming submicrometer technology age.