1979
DOI: 10.1016/0039-6028(79)90341-8
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Ion-induced electron emission from clean metals

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Cited by 265 publications
(106 citation statements)
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“…The secondary electron emission yield (γSE) is influenced by the ionization energy of the working gas (Ip) and the work function (φ) of the target surface 33 . Upon introduction of N2 to the Si-discharge, the effective Ip of the process gas does not change considerably owing to similar ionization energies of N2 (IP(N2) = 15.6 eV) and N (IP(N) = 14.53 eV) and Ar (IP(Ar) = 15.75 eV).…”
Section: Process Characteristics and Plasma Characterizationmentioning
confidence: 99%
“…The secondary electron emission yield (γSE) is influenced by the ionization energy of the working gas (Ip) and the work function (φ) of the target surface 33 . Upon introduction of N2 to the Si-discharge, the effective Ip of the process gas does not change considerably owing to similar ionization energies of N2 (IP(N2) = 15.6 eV) and N (IP(N) = 14.53 eV) and Ar (IP(Ar) = 15.75 eV).…”
Section: Process Characteristics and Plasma Characterizationmentioning
confidence: 99%
“…emission associated with the ionization potential of the arriving ion [52]. Experimental data of the secondary emission yields for various ions satisfy the fit [54]   0.032 0.78 2…”
Section: The Evolution Of the Secondary Electron Emission And Ionizatmentioning
confidence: 99%
“…It has been known for some years that the issue of very low net γ could be further aggravated when singly charged metal ions replace the noble gas ions during each HiPIMS 3 pulse. 9 The yield for singly charged metal ions is zero based on Baragiola's empirical yield formula 10 …”
mentioning
confidence: 99%