Ion entrainment by electrons in metals

Photo‐Induced Evolution of Randomly Rough Surfaces of Amorphous Chalcogenide Films

“…Comparison of Equation ( 7) and (11) gives the following time dependence of the Fourier transform of the correlation function Wðq, tÞ ¼ Wðq.0Þ exp½À2κðqÞt (12) After substitution of Equation ( 12) into ( 6) we obtain Iðq, tÞ ¼ Iðq, 0Þ exp½À2κðqÞt (13) where the exponent κðqÞ is determined by the constants characterizing the PI mass transfer kinetics in accordance with Equations ( 4) and (5). It is evident from Equation ( 13) that the intensity of light scattered at the angle θ s -θ in (i.e., for given q) varies exponentially with time and, depending on the sign of k, either increases or decreases as the surface relief grows or flattens.…”

“…Effective electric charge, q eff , of ACF constituents appears due to the motion of the electrons and holes in electric field that creates so‐called electronic and hole winds. [ 11 ] Atoms are dragged by electrons and holes moving in an electric field, so that the resulting value and sign of q eff depends on the cross‐section of scattering of the carriers on the atoms. It was previously shown [ 12 ] that the mass transfer in As 20 Se 80 films was directed towards higher light intensity where surface profile had a positive curvature.…”