1998
DOI: 10.1063/1.1148865
|View full text |Cite
|
Sign up to set email alerts
|

Ion energy and mass analyzer at radio frequency electrode in a plasma chamber

Abstract: Measurement of ion energy distributions using a combined energy and mass analyzer Rev. Sci. Instrum. 78, 083503 (2007); 10.1063/1.2769352Low-cost modification for the high-frequency raster on the Cameca IMS-3F secondary ion mass spectrometer

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
11
0

Year Published

2000
2000
2021
2021

Publication Types

Select...
8

Relationship

1
7

Authors

Journals

citations
Cited by 14 publications
(11 citation statements)
references
References 5 publications
(5 reference statements)
0
11
0
Order By: Relevance
“…In addition RFEAs have also been used to measure electron energy distribution functions (EEDF) by other groups [4]. To date, RFEA's have been used mainly for IED measurement [5,6,7,8,9], with only limited application to in-situ determination of ion flux density [10] due to the lack of a clear consensus on how best to calibrate its ion current density measurements.…”
Section: Introductionmentioning
confidence: 99%
“…In addition RFEAs have also been used to measure electron energy distribution functions (EEDF) by other groups [4]. To date, RFEA's have been used mainly for IED measurement [5,6,7,8,9], with only limited application to in-situ determination of ion flux density [10] due to the lack of a clear consensus on how best to calibrate its ion current density measurements.…”
Section: Introductionmentioning
confidence: 99%
“…The plasma was generated by a one turn inductively coupled coil, and the energy of the ions that bombard the rf biased electrode were analyzed through an orifice in the electrode. 13,14 The voltage signals from the current meter in the rf potential were converted into frequency signals, they were then transmitted to the grounded computer through the optical fiber, and finally, the data was acquired using LABVIEW on the computer. The analyzer that was used for the IED and IAD measurements is shown in Fig.…”
Section: Methodsmentioning
confidence: 99%
“…The etching characteristics, that is, the etching rate, the profile, and the selectivity for the different materials depend on the ion energy. 13,14 Such rf floating IEA devices have been developed and used. 1 The energy distributions of ions that bombarded the grounded electrodes in plasma apparatuses, have been measured by many groups during the past 30 years.…”
Section: Introductionmentioning
confidence: 99%
“…The energy and mass distributions of the ions and radicals in a plasma depend on various process parameters, and they play an important role in controlling semiconductor processes such as etching, cleaning, and deposition. Thus, it is important to measure and analyze the distribution of the plasma species in a plasma [1][2][3][4][5][6][7].…”
Section: Introductionmentioning
confidence: 99%