2006
DOI: 10.1007/s00340-006-2532-3
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Ion debris mitigation from tin plasma using ambient gas, magnetic field and combined effects

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Cited by 59 publications
(42 citation statements)
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“…This is caused by ionization of ambient gas atoms by prompt electrons and/or intense EUV light coming out from the early stages of plasma formation. 16,20 During initial times of plume expansion, the ablated species streams away from the target surface with supersonic free expansion. As time evolves, the plasma species start to sweep background gas species, leading to a pile of mass at the ablation front.…”
Section: Resultsmentioning
confidence: 99%
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“…This is caused by ionization of ambient gas atoms by prompt electrons and/or intense EUV light coming out from the early stages of plasma formation. 16,20 During initial times of plume expansion, the ablated species streams away from the target surface with supersonic free expansion. As time evolves, the plasma species start to sweep background gas species, leading to a pile of mass at the ablation front.…”
Section: Resultsmentioning
confidence: 99%
“…For collecting ions the FC is positioned at 15 cm away from the target surface and at an angle approximately 12 degrees with respect to the target normal. Since the presence of ambient partial pressure can slow down the fast moving ions, 16 the ion kinetic profiles recorded with the FC are done in vacuum. The ion TOF profile in vacuum is represented by a sharp prompt peak followed by a broad slower peak.…”
Section: Resultsmentioning
confidence: 99%
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