An alternative secondary ion mass spectrometry utilizing laser preionization is introduced. The native Ag sample surface is first irradiated with laser pulse (100 fs duration, 10 10 -10 11 W/cm 2 intensity, 1240 nm wavelength) and subsequently bombarded with primary ions (Bi 3 + , 10 ns duration, 25 keV energy). Multiple correlation patterns are observed in the mass spectra, confirming the mutual laser-secondary ion mass spectrometry (SIMS) interplay in the preionization mechanism. The Ag respectively. Two ionization mechanisms are identified, the ion sputtering regime for intensities of less than 1.4×10 11 W/cm 2 and the multiphoton ionization at higher intensities. The Ag saturation intensity obtained from fitting is 2.4×10 13 W/cm 2 , close to the one reported for postionization. The proposed preionization approach might eliminate the need for high peak power/high intensity laser source and, moreover, the experiment geometry ensures that large areas of the sample are affected by the laser beam.