Ion-beam-assisted texturing of YSZ layers

Dzick, J.; Hoffmann, J.; Sievers, S.; Kautschor, L.-O.; Freyhardt, H.C.

doi:10.1016/s0921-4534(02)00892-4

Cited by 18 publications

(8 citation statements)

References 7 publications

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“…Detailed transmission electron microscopy (TEM) and x-ray diffraction studies of IBAD-YSZ growth found that the films evolved from an initial layer with a (110) fiber texture. 58 The Ar bombardment causes the film stress to continually increase up to a thickness of ϳ50 nm, at which point a transition layer of mixed (110)-oriented and (100)-oriented grains begins to grow and the film stress is reduced. Orientationdependent sputtering causes the (100) grains to have weak azimuthal alignment …”

Section: Biaxially Textured Ibad-mgo Templates For Ybco-coated Conducmentioning

confidence: 99%

“…82,83 Several years of development were needed before the first short-sample I c Х 100 A/cmwidth results could be repeated for meterlength coated conductors. [84][85][86] In addition to the IBAD deposition parameters discussed earlier, gun divergence for the large-area sources had to be minimized. For experiments with small-area ion sources, this was easily done, in that good collimation was readily achieved by maximizing source-to-substrate distances.…”

Section: Mrs Bulletin/august 2004 547mentioning

confidence: 99%

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Biaxially Textured IBAD-MgO Templates for YBCO-Coated Conductors

Arendt¹,

Foltyn²

2004

MRS Bull.

194

120

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IntroductionIn the area of second-generation hightemperature superconductor (HTS) wires, there are vigorous programs that have been undertaken by various institutions and consortia to develop long lengths of highquality superconducting tape using costefficient manufacturing techniques. The methodologies employed include diverse processes used to fabricate YBa 2 Cu 3 O 7-␦ (YBCO) HTS films as well as the biaxially textured template platforms on which the superconducting films are deposited.Ion-beam-assisted deposition (IBAD) of cubic metal oxide films is one of the approaches being pursued to form such textured templates. Within the IBAD research community, there have been many different cubic metal and metal oxide materials that have been demonstrated to be biaxially textured to some degree. Two of these that are currently being used as templates for long-length coated conductors are yttrium-stabilized zirconia (YSZ) and gadolinium zirconate (GZO). These are described in the article by Iijima et al. in this issue. A third template, magnesia (MgO), is the focus of this article. Before discussing IBAD-MgO and its specific advantages and disadvantages relative to the other IBAD templates, it is useful to briefly review the history of ion-beam processing methods employed to texture films. Early History of Ion-Beam TexturingExperimental studies of the penetration of medium-energy ions (15-75 keV) in single crystals of fcc metals (Au and Al) found that the ion-penetration ranges decrease sequentially along the [110], [100], and [111] crystallographic directions, respectively. 1-3 Computer simulations using Born-Mayer potentials to describe the range variations with crystallographic orientation of 5 keV Cu atoms in fcc Cu single crystals corroborated the experimental penetration distributions observed for Au and Al. 4 It was concluded that channeling processes along the principal axes of fcc crystal lattices were responsible for the qualitative resemblance between the experimental and calculated penetration range results. 2,3 Analyses were also performed for 1-10 keV Cu atoms incident on various crystallographic directions of fcc, diamond, and bcc lattices. 5 These calculations resulted in an ordering of the channeling range dependencies for the Cu atom penetrations as a function of direction and lattice type. For the three lattice types studied, this ordering is illustrated in Table I, with the range variations listed in order from highest to lowest for the three lowindex directions. Sputter experiments using Cu and Ag single crystals for 1-10-keV Ar ions impacting within a few degrees of the three low-index planes found that the sputter yields progress from lowest to highest for the [110], [100], and [111] directions, respectively. 6 These sputter yield versus crystalline orientation results agreed with the predicted range variations for the fcc lattices, in that the probability of atoms being sputtered from a material is greater if the collisions between the incident ions and the atoms of the solid occur nearer to it...

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Section: Biaxially Textured Ibad-mgo Templates For Ybco-coated Conducmentioning

confidence: 99%

Section: Mrs Bulletin/august 2004 547mentioning

confidence: 99%

Biaxially Textured IBAD-MgO Templates for YBCO-Coated Conductors

Arendt¹,

Foltyn²

2004

MRS Bull.

194

120

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“…welches die Anisotropie der Eindringtiefe im Festkörper beschreibt [Behrisch 1983]. In , Yu et al 1986, Bradley et al 1986, Iijima et al 1993, Wiesmann 1998, Dzick et al 2002. Zusammenfassend kann gesagt werden, dass eine anisotrope Defektbildung, wie sie in YSZ und MgO beobachtet [Kautschor 2002, Kung et al 2001 und von verschiedenen Autoren erklärt wurde [Ressler et al 1997, Dong und Srolovitz 1999, Dong et al 2001, Zepeda-Ruiz und Srolovitz 2002, Carter 2000 wird [Iijima et al 1991], CeO 2 [Zhu et al 1994, Wiesmann et al 1995, Gnanarajan et al 1997, Gnanarajan und Savvides 1999, Wiesmann 1998], CeO 2 mit 10 at% Gd 2 O 3 [Wiesmann 1998] und Pr 6 O 11 [Betz et al 1997 [Arendt et al 2002], außerdem erhält man bereits in sehr dünnen Schichten eine ausgezeichnete Textur, die dann allerdings oberhalb von etwa 10 nm degradiert [Wang et al 1997].…”

Section: Mechanismen Der Texturentwicklungunclassified

“…Die mittels TEM untersuchten mikroskopischen Mechanismen, die zur Texturausbildung führen, scheinen aber bezüglich eines versetzungsvermittelten Mechanismus vergleichbar zu sein [Kautschor 2002, Kung et al 2001 Channelingrichtungen. YSZ-Daten aus [Dzick, 2002], GZO-Daten aus [Thiele 2003] MgO-Daten aus [Wang et al 1997], Y 2 O 3 -Textur aus [Betz 1998]. Abtragsraten nicht signifikant verschieden sind [Ressler et al 1997, Thiele 2003 [Mao et al 1997, Iijima et al 1997], führen bei Dzick Einfallswinkel 35°< χ< 55° nur zu einer leichten Texturverschlechterung [Dzick 1996].…”

Section: Mechanismen Der Texturentwicklungunclassified