Abstract:In some Resistive Random Access Memories, the high and low resistance states (HRS and LRS, respectively) are associated to the creation (Set) and disruption (Reset) of a conductive filament (CF) that locally connects or disconnects the electrodes. Usually, a current limit (CL) must be fixed during the Set process. Typically, these devices are characterized using semiconductor parameter analyzers (SPA), which have a low sampling rate and a somehow uncontrolled current limitation mechanism. In this work, a lowc… Show more
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