“…MAUD software 21 based on Rietveld profile method 22 was used in order to determine the crystal structure and microstructure from Xray diffraction data (XRD) of the samples which were measured using X'pert MPD, Philips (2θ = 10°-80°, step = 002°, counting time = 2 seconds, Cu-K α ). 24 Figure 2A, Figure 3 shows the Fourier transforms infrared spectroscopy spectra (FTIR) for CuS with different Cu:S ratio and Mgdoped nano CuS samples measured at room temperature in the range of 400-4000 cm −1 . UV-Vis, photoluminescence (PL) and Fourier transform infrared (FTIR) were conducting by Shimadzu UV-3101PC UV-Vis-NIR scanning spectrometer, luminescence spectrophotometer (RF-1501 SHIMADZU, Ltd) with a resolution of 10 nm and Bruker Tensor 27 FTIR spectrometer, respectively.…”